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Simulation study of an x-ray sub-picosecond resolution detection system based on time-domain amplification 期刊论文
APPLIED OPTICS, 2023, 卷号: 62, 期号: 20, 页码: 5452-5458
作者:  Wang, Gang;  Liu, Yiheng;  Yan, Xin;  Gao, Guilong;  Wang, Tao;  Li, Lili;  Zhao, Yuetong;  Zhao, Jinbo;  He, Kai;  Tian, Jinshou
Adobe PDF(7564Kb)  |  收藏  |  浏览/下载：89/1  |  提交时间：2023/08/23
Theoretical and experimental study on responsivity of ultra-fast X-ray semiconductor chip based on the rad-optic effect 期刊论文
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2023, 卷号: 1049
作者:  Yan, Xin;  Wang, Tao;  Wang, Gang;  Yao, Dong;  Liu, Yiheng;  Gao, Guilong;  Xin, Liwei;  Yin, Fei;  Tian, Jinshou;  Chang, Xinlong;  He, Kai
Adobe PDF(2250Kb)  |  收藏  |  浏览/下载：146/1  |  提交时间：2023/02/28
X-ray detector  Rad-optic effect  Ultrafast response semiconductor material  Responsivity  Ultrafast measurements  
Theoretical and experimental study on Noise Equivalent Power of X-ray semiconductor ultra-fast response material based on the rad-optic effect 预印本
2022
作者:  Yan, Xin;  Wang, Tao;  Wang, Gang;  Yao, Dong;  Liu, Yiheng;  Gao, Guilong;  Xin, Liwei;  Yin, Fei;  Tian, Jinshou;  Chang, Xinlong;  He, Kai
Adobe PDF(1169Kb)  |  收藏  |  浏览/下载：109/3  |  提交时间：2022/08/23
Signal recovery of a Fabry-Pérot interferometric x-ray pulse detector based on the RadOptic effect 期刊论文
Journal of Applied Physics, 2022, 卷号: 131, 期号: 6
作者:  Wang, Gang;  He, Kai;  Liu, Yiheng;  Yan, Xin;  Gao, Guilong;  Wang, Tao;  Yuan, Xiaohui;  Zhao, Xu;  Dong, Yufeng;  Tian, Jinshou
Adobe PDF(3168Kb)  |  收藏  |  浏览/下载：190/3  |  提交时间：2022/03/09
Depth profiling of the refractive index from probe beam deflections induced by a serrated pump illumination on GaAs 期刊论文
JOURNAL OF MODERN OPTICS, 2017, 卷号: 64, 期号: 5, 页码: 431-438
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong
Adobe PDF(2449Kb)  |  收藏  |  浏览/下载：327/4  |  提交时间：2017/04/21
Index Quantifying  Photo-induced Refractive Index Change  Gradient  Optical Beam Deflection  Pump Probe  
Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：177/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium