Xi'an Institute of Optics and Precision Mechanics,CAS
Depth profiling of the refractive index from probe beam deflections induced by a serrated pump illumination on GaAs | |
Liang, Lingliang1,2,3; Tian, Jinshou1; Wang, Tao1; Wu, Shengli3; Li, Fuli3; Gao, Guilong1,2,3 | |
作者部门 | 精密物理量测量实验室 |
2017 | |
发表期刊 | JOURNAL OF MODERN OPTICS |
ISSN | 0950-0340 |
卷号 | 64期号:5页码:431-438 |
产权排序 | 1 |
摘要 | We demonstrate a method to experimentally quantify the distribution with depth of photo-induced refractive index generated by a pump illumination, which is spatially modulated by a serrated mask on the surface of bulk GaAs. This photo-induced refractive index change distributes inhomogeneously with depth thus deflecting the probe beam transversely passing through the depth direction. The refractive index distribution with depth is deduced from the set of deflections of probe beam with respect to the propagating distances, which is collected experimentally in a pump probe arrangement. The obtained set of deflections of probe beam is theoretically proved to be reliable. |
文章类型 | Article |
关键词 | Index Quantifying Photo-induced Refractive Index Change Gradient Optical Beam Deflection Pump Probe |
WOS标题词 | Science & Technology ; Physical Sciences |
DOI | 10.1080/09500340.2016.1241902 |
收录类别 | SCI ; EI |
关键词[WOS] | SURFACE RECOMBINATION VELOCITY ; WAVE-GUIDES ; Z-SCAN ; MODULATION ; DESIGN ; LASER |
语种 | 英语 |
WOS研究方向 | Optics |
项目资助者 | National Natural Science Foundation of China(11274377 ; State Major Research Equipment Project(ZDY2011-2) ; 61176006) |
WOS类目 | Optics |
WOS记录号 | WOS:000394546700001 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/28744 |
专题 | 条纹相机工程中心 |
作者单位 | 1.Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian, Peoples R China 2.Chinese Acad Sci, Coll Mat Sci & Optoelect Technol, Grad Univ, Beijing, Peoples R China 3.Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Xian, Peoples R China |
推荐引用方式 GB/T 7714 | Liang, Lingliang,Tian, Jinshou,Wang, Tao,et al. Depth profiling of the refractive index from probe beam deflections induced by a serrated pump illumination on GaAs[J]. JOURNAL OF MODERN OPTICS,2017,64(5):431-438. |
APA | Liang, Lingliang,Tian, Jinshou,Wang, Tao,Wu, Shengli,Li, Fuli,&Gao, Guilong.(2017).Depth profiling of the refractive index from probe beam deflections induced by a serrated pump illumination on GaAs.JOURNAL OF MODERN OPTICS,64(5),431-438. |
MLA | Liang, Lingliang,et al."Depth profiling of the refractive index from probe beam deflections induced by a serrated pump illumination on GaAs".JOURNAL OF MODERN OPTICS 64.5(2017):431-438. |
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文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Depth profiling of t(2449KB) | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | 浏览 请求全文 |
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