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A High-Sensitivity Vacuum Diode Temperature Sensor Based on Barrier-Lowering Effect 期刊论文
Micromachines, 2022, 卷号: 13, 期号: 2
作者:  Shen, Zhihua;  Wang, Xiao;  Li, Qiaoning;  Ge, Bin;  Jiang, Linlin;  Tian, Jinshou;  Wu, Shengli
Adobe PDF(2077Kb)  |  收藏  |  浏览/下载：221/2  |  提交时间：2022/03/01
vacuum diode  electric field assisted thermionic emission  temperature sensor  
Nanoscale vacuum diode based on thermionic emission for high temperature operation 期刊论文
Micromachines, 2021, 卷号: 12, 期号: 7
作者:  Shen, Zhihua;  Li, Qiaoning;  Wang, Xiao;  Tian, Jinshou;  Wu, Shengli
Adobe PDF(1516Kb)  |  收藏  |  浏览/下载：158/2  |  提交时间：2021/07/20
finite integration technique (FIT)  thermionic emission  nanoscale vacuum diode  spacecharge limited (SCL) current  
A new kind of vertically aligned field emission transistor with a cylindrical vacuum channel 期刊论文
VACUUM, 2017, 卷号: 137, 页码: 163-168
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, Jinshou;  Wu, Shengli (slwu@mail.xjtu.edu.cn)
Adobe PDF(1331Kb)  |  收藏  |  浏览/下载：174/2  |  提交时间：2017/01/22
Finite Integration Technique (Fit)  Vacuum Channel  Field Emission Transistor  
Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2016, 卷号: 26, 期号: 4
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, JinShou
Adobe PDF(2165Kb)  |  收藏  |  浏览/下载：154/2  |  提交时间：2016/09/14
Finite Integration Technique (Fit)  Nanometer-scale Fissure  Surface-conduction Electron Emitter  
Numerical simulation of surface-conduction electron-emitter 会议论文
, Beijing, China, 2015-04-27
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, Jinshou
Adobe PDF(538Kb)  |  收藏  |  浏览/下载：194/3  |  提交时间：2016/02/02
Electron Emitter  Numerical Simulation  Cst Particle Studio  Surface-conduction Electron-emission