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A numerical algorithm to evaluate the transient response for a synchronous scanning streak camera using a time-domain Baum Liu Tesche equation 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2016, 卷号: 832, 页码: 8-14
作者:  Pei, Chengquan;  Tian, Jinshou;  Wu, Shengli;  He, Jiai;  Liu, Zhen;  Wu, Shengli (slwu@mail.xjtu.edu.cn)
Adobe PDF(819Kb)  |  收藏  |  浏览/下载：190/5  |  提交时间：2016/10/13
Baum-liu-tesche Equation  Numerical Method  Scanning Deflection Plate  Synchronous Scanning Streak Camera  Transient Response  
Ultrafast optical beam deflection in a pump probe configuration 期刊论文
CHINESE PHYSICS B, 2016, 卷号: 25, 期号: 9
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Wang, Junfeng;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(2998Kb)  |  收藏  |  浏览/下载：221/7  |  提交时间：2016/10/09
Pump Probe  Ultrafast Deflection  Multiple-prism Light Deflector  Temporal Resolution  
Numerical analysis of the surface-conduction electron-emitter with a new configuration 期刊论文
MODERN PHYSICS LETTERS B, 2016, 卷号: 30, 期号: 10
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, Jinshou
Adobe PDF(856Kb)  |  收藏  |  浏览/下载：172/3  |  提交时间：2017/03/14
Surface-conduction Electron-emitter  Finite Integration Technique  
Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2016, 卷号: 26, 期号: 4
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, JinShou
Adobe PDF(2165Kb)  |  收藏  |  浏览/下载：153/2  |  提交时间：2016/09/14
Finite Integration Technique (Fit)  Nanometer-scale Fissure  Surface-conduction Electron Emitter  
Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：173/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium