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Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2016, 卷号: 26, 期号: 4
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, JinShou
Adobe PDF(2165Kb)  |  收藏  |  浏览/下载：153/2  |  提交时间：2016/09/14
Finite Integration Technique (Fit)  Nanometer-scale Fissure  Surface-conduction Electron Emitter  
Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：173/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium