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Theoretical and experimental study on responsivity of ultra-fast X-ray semiconductor chip based on the rad-optic effect 期刊论文
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2023, 卷号: 1049
作者:  Yan, Xin;  Wang, Tao;  Wang, Gang;  Yao, Dong;  Liu, Yiheng;  Gao, Guilong;  Xin, Liwei;  Yin, Fei;  Tian, Jinshou;  Chang, Xinlong;  He, Kai
Adobe PDF(2250Kb)  |  收藏  |  浏览/下载：148/1  |  提交时间：2023/02/28
X-ray detector  Rad-optic effect  Ultrafast response semiconductor material  Responsivity  Ultrafast measurements  
Study on the transit time spread characteristic of 20-in. hybrid photomultiplier tube used for high-energy particle detection 期刊论文
AIP Advances, 2022, 卷号: 12, 期号: 4
作者:  Xin, Liwei;  Shen, Tao;  Tian, Jinshou;  Guo, Lehui;  Liu, Hulin;  Chen, Ping;  Xue, Yanhua;  Ji, Chao;  Wang, Xing;  Gao, Guilong;  He, Kai
Adobe PDF(9397Kb)  |  收藏  |  浏览/下载：158/6  |  提交时间：2022/04/25
Numerical Simulation on Magnetic Field Tolerance of MCP-PMTs 期刊论文
IEEE Transactions on Nuclear Science, 2022, 卷号: 69, 期号: 4, 页码: 850-857
作者:  Li, Lili;  Tian, Jinshou;  Chen, Ping;  Guo, Lehui;  Wang, Xing;  Liu, Hulin;  Xue, Yanhua;  Xin, Liwei;  Gao, Guilong;  He, Kai;  Gou, Yongsheng;  Zhang, Mingrui;  Li, Shaohui;  Sai, Xiaofeng;  Liu, Baiyu;  Xu, Xiangyan;  Qu, Youshan;  Zhao, Wei
Adobe PDF(2748Kb)  |  收藏  |  浏览/下载：161/9  |  提交时间：2022/03/09
magnetic field tolerance  MCP  electron clouds  MCP-PMT  
Effects of secondary electron emission yield properties on gain and timing performance of ALD-coated MCP 期刊论文
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2021, 卷号: 1005
作者:  Guo, Lehui;  Xin, Liwei;  Li, Lili;  Gou, Yongsheng;  Sai, Xiaofeng;  Li, Shaohui;  Liu, Hulin;  Xu, Xiangyan;  Liu, Baiyu;  Gao, Guilong;  He, Kai;  Zhang, Mingrui;  Qu, Youshan;  Xue, Yanhua;  Wang, Xing;  Chen, Ping;  Tian, Jinshou
Adobe PDF(2930Kb)  |  收藏  |  浏览/下载：253/10  |  提交时间：2021/05/24
Microchannel plate (MCP)  Secondary electron emission (SEE) yield  Gain  Timing performance