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Numerical Simulation on Magnetic Field Tolerance of MCP-PMTs
Li, Lili1; Tian, Jinshou2; Chen, Ping3; Guo, Lehui1; Wang, Xing1; Liu, Hulin1; Xue, Yanhua1; Xin, Liwei1; Gao, Guilong1; He, Kai1; Gou, Yongsheng1; Zhang, Mingrui1; Li, Shaohui1; Sai, Xiaofeng1; Liu, Baiyu1; Xu, Xiangyan1; Qu, Youshan1; Zhao, Wei1
作者部门条纹相机工程中心
2022-04
发表期刊IEEE Transactions on Nuclear Science
ISSN00189499;15581578
卷号69期号:4页码:850-857
产权排序1
摘要

Microchannel plate photomultiplier tubes (MCP-PMT) with high temporal resolution and low dark count rates will be employed as single-photon detectors for the Super Tau-Charm Facility (STCF) proposed in China. Similar to other RICH or DIRC detectors, MCP-PMTs in the STCF need to operate properly in an axial magnetic field of about 1.5T. We study the magnetic field tolerance of MCP-PMTs with simulation methods based on the Furman model as a secondary electron emission model and the particle-in-cell method for tracking electrons. The effects of MCP structural parameters (aperture D, length-to-diameter ratio L/D, bias angle , and applied voltage U) on the magnetic field tolerance are simulated. Results show that the smaller D and the smaller L/D of the MCP, the better its magnetic field tolerance. By increasing the MCP bias angle, its magnetic field tolerance increases first and then weaken. The applied voltage does not affect its magnetic field tolerance. Changing the angle between the magnetic field and the normal direction to the MCP, the gain decays fastest when the magnetic field direction is parallel to the axial direction of the MCP channels; at a magnetic field direction of 60 degrees, the MCP gain decays the slowest. For MCP-PMTs, the change of the magnetic field direction causes the alteration of the motion direction of the electron cloud in the gaps (cathode-MCP1, MCP1-MCP2, MCP2-anode), which is the principal reason for the difference in its gain in different magnetic field directions with the same magnetic field strength. The magnetic field tolerance of different assembly methods of two MCPs (i.e., two-electrodes, three-electrodes, or four-electrodes for applying high voltage) are simulated. The results show that two MCPs multiplication structure with the four electrodes assembly method is an appropriate choice. IEEE

关键词magnetic field tolerance MCP electron clouds MCP-PMT
DOI10.1109/TNS.2022.3150890
收录类别SCI ; EI
语种英语
WOS记录号WOS:000803113800036
出版者Institute of Electrical and Electronics Engineers Inc.
EI入藏号20220811679431
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/95719
专题条纹相机工程中心
作者单位1.Key Laboratory of Ultrafast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China, and University of Chinese Academy of Sciences (UCAS), Beijing 100049, China.;
2.Key Laboratory of Ultrafast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China, and University of Chinese Academy of Sciences (UCAS), Beijing 100049, China, and Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China.;
3.Key Laboratory of Ultrafast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China, and University of Chinese Academy of Sciences (UCAS), Beijing 100049, China, and Key Laboratory for Laser Plasmas (Ministry of Education) and School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China.
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GB/T 7714
Li, Lili,Tian, Jinshou,Chen, Ping,et al. Numerical Simulation on Magnetic Field Tolerance of MCP-PMTs[J]. IEEE Transactions on Nuclear Science,2022,69(4):850-857.
APA Li, Lili.,Tian, Jinshou.,Chen, Ping.,Guo, Lehui.,Wang, Xing.,...&Zhao, Wei.(2022).Numerical Simulation on Magnetic Field Tolerance of MCP-PMTs.IEEE Transactions on Nuclear Science,69(4),850-857.
MLA Li, Lili,et al."Numerical Simulation on Magnetic Field Tolerance of MCP-PMTs".IEEE Transactions on Nuclear Science 69.4(2022):850-857.
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