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Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：173/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium  
Numerical simulation of surface-conduction electron-emitter 会议论文
, Beijing, China, 2015-04-27
作者:  Shen, Zhihua;  Wang, Xiao;  Wu, Shengli;  Tian, Jinshou
Adobe PDF(538Kb)  |  收藏  |  浏览/下载：193/3  |  提交时间：2016/02/02
Electron Emitter  Numerical Simulation  Cst Particle Studio  Surface-conduction Electron-emission