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GaAs material photorefractive response time measurement based on spectral probe 会议论文
FOURTH INTERNATIONAL CONFERENCE ON PHOTONICS AND OPTICAL ENGINEERING, Xian, PEOPLES R CHINA, 2020-10-15
作者:  Yang, Qing;  Yin, Fei;  Wang, Tao;  Gao, Guilong;  He, Kai;  Yan, Xin
Adobe PDF(427Kb)  |  收藏  |  浏览/下载：148/5  |  提交时间：2021/07/23
Ultrafast time-response characteristics of AlGaAs materials 会议论文
9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR SENSING AND IMAGING, Chengdu, PEOPLES R CHINA, 2018-06-26
作者:  Yin, Fei;  Yang, Qing;  Wang, Tao;  Gao, Guilong;  He, Kai;  Yan, Xin;  Li, Shaohui
Adobe PDF(511Kb)  |  收藏  |  浏览/下载：163/5  |  提交时间：2019/04/04
Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：176/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium