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Measurement of excited layer thickness in highly photo-excited GaAs 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli;  Gao, Guilong;  Liang, Lingliang (lianglingliang@opt.cn)
Adobe PDF(473Kb)  |  收藏  |  浏览/下载：199/1  |  提交时间：2017/01/17
Gallium Arsenide  Optical Data Processing  Optical Variables Measurement  Probes  Semiconducting Gallium  
Reflectivity and depth images based on time-correlated single photon counting technique 会议论文
Optical Measurement Technology and Instrumentation, Beijing, China, 2016-05-09
作者:  Duan, Xuejie;  Ma, Lin;  Kang, Yan;  Zhang, Tongyi
Adobe PDF(819Kb)  |  收藏  |  浏览/下载：253/0  |  提交时间：2017/01/17
Imaging Systems  Optical Data Processing  Optical Variables Measurement  Particle Beams  Pixels  Reflection  Structured Programming  Transceivers