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Influence of Driving Frequency on the Argon Dielectric Barrier Discharge Excited by Gaussian Voltage at Atmospheric Pressure 期刊论文
IEEE TRANSACTIONS ON PLASMA SCIENCE, 2016, 卷号: 44, 期号: 11, 页码: 2553-2563
作者:  Xu, Yonggang;  Jiang, Weiman;  Tang, Jie;  Zhu, Sha;  Wang, Yishan;  Li, Yongfang;  Zhao, Wei;  Duan, Yixiang;  Tang, J (reprint author), Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China.
Adobe PDF(2631Kb)  |  收藏  |  浏览/下载：187/1  |  提交时间：2016/12/23
Argon Dielectric Barrier Discharge (Dbd)  Driving Frequency  Gaussian Voltage  Mode Transition  Residual Current Peak  
Numerical simulation of thermo-mechanical behavior in high power diode laser arrays 会议论文
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016, Wuhan, China, 2016-08-16
作者:  Lu, Yao;  Nie, Zhiqiang;  Zhang, Pu;  Wang, Zhenfu;  Xiong, Lingling;  Wang, Shuna;  Wu, Dihai;  Liu, Xingsheng
Adobe PDF(2218Kb)  |  收藏  |  浏览/下载：245/1  |  提交时间：2016/11/22
Computer Simulation  Electronics Packaging  High Power Lasers  Numerical Models  Occupational Risks  Optical Properties  Packaging  Power Semiconductor Diodes  Shear Stress  Thermal Stress  
Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode 会议论文
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016, Wuhan, China, 2016-08-16
作者:  Nie, Zhiqiang;  Wu, Di;  Lu, Yao;  Wu, Dhai;  Wang, Shuna;  Zhang, Pu;  Xiong, Lingling;  Li, Xiaoning;  Shen, Zenan
Adobe PDF(1806Kb)  |  收藏  |  浏览/下载：223/1  |  提交时间：2016/11/22
Chip Scale Packages  Defects  Degradation  Electronics Packaging  High Power Lasers  Laser Beam Welding  Power Semiconductor Diodes  Reliability  Reliability Analysis  Semiconductor Diodes