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Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode 会议论文
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016, Wuhan, China, 2016-08-16
作者:  Nie, Zhiqiang;  Wu, Di;  Lu, Yao;  Wu, Dhai;  Wang, Shuna;  Zhang, Pu;  Xiong, Lingling;  Li, Xiaoning;  Shen, Zenan
Adobe PDF(1806Kb)  |  收藏  |  浏览/下载：248/1  |  提交时间：2016/11/22
Chip Scale Packages  Defects  Degradation  Electronics Packaging  High Power Lasers  Laser Beam Welding  Power Semiconductor Diodes  Reliability  Reliability Analysis  Semiconductor Diodes  
Laser scanning stereomicroscopy for fast volumetric imaging with two-photon excitation and scanned Bessel beams 会议论文
MULTIPHOTON MICROSCOPY IN THE BIOMEDICAL SCIENCES XV, San Francisco, CA, 2015-02-08
作者:  Yang, Yanlong;  Zhou, Xing;  Li, Runze;  Van Horn, Mark;  Peng, Tong;  Lei, Ming;  Wu, Di;  Chen, Xun;  Yao, Baoli;  Ye, Tong
Adobe PDF(267Kb)  |  收藏  |  浏览/下载：251/0  |  提交时间：2015/12/04