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Satellite Pose Measurement Using an Improving SIFT Algorithm
Zhang, Renhao1,2; Zhou, Zuofeng1,3
2024
会议名称4th International Conference on Computer Vision and Data Mining, ICCVDM 2023
会议录名称Fourth International Conference on Computer Vision and Data Mining, ICCVDM 2023
卷号13063
会议日期2023-10-20
会议地点Changchun, China
出版者SPIE
产权排序1
摘要Due to the strong reflective properties of the spacecraft surface coatings, there are significant challenges in processing images from outer space. Furthermore, the volume of data for image feature processing and matching is immense, and existing algorithms are insufficient for aerospace system applications. Therefore, this paper proposes a three-dimensional pose measurement algorithm based on binocular vision. The binocular vision-based three-dimensional pose measurement system consists of four main components: camera calibration, camera rectification, stereo matching, and pose determination. Traditional image processing algorithms are employed for satellite image processing. Camera calibration is performed using M software, and the calibration results are further optimized. Due to real-time requirements, an improved SIFT algorithm is used to detect local features in the images, extract feature points, and perform feature point matching under epipolar constraints. Experimental results demonstrate that this algorithm can achieve accurate and fast three-dimensional pose measurement. © 2024 SPIE.
关键词Binocular Vision Stereo Matching Pose Measurement
作者部门飞行器光学成像与测量技术研究室
DOI10.1117/12.3021301
收录类别EI
ISBN号9781510674448
语种英语
ISSN号0277786X;1996756X
EI入藏号20241115744309
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文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/97273
专题飞行器光学成像与测量技术研究室
作者单位1.Xi'an Institute of Optics and Precision Mechanics of UCAS, Chinese Academy of Sciences, Shaanxi, Xi'an; 710119, China;
2.University of Chinese Academy of Sciences, Beijing; 100049, China;
3.Xi’an Key Laboratory of Spacecraft Optical Imaging and Measurement Technology, Shaanxi, Xi'an; 710119, China
推荐引用方式
GB/T 7714
Zhang, Renhao,Zhou, Zuofeng. Satellite Pose Measurement Using an Improving SIFT Algorithm[C]:SPIE,2024.
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