Redundant information model for Fourier ptychographic microscopy | |
Gao, Huiqin1,2,3; Pan, An1,3; Gao, Yuting1,3; Zhang, Yu1,4; Wan, Quanzhen1,5; Mu, Tingkui2; Yao, Baoli1,3![]() | |
作者部门 | 瞬态光学研究室 |
2023-12-18 | |
发表期刊 | Optics Express
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ISSN | 10944087 |
卷号 | 31期号:26页码:42822-42837 |
产权排序 | 1 |
摘要 | Fourier ptychographic microscopy (FPM) is a computational optical imaging technique that overcomes the traditional trade-off between resolution and field of view (FOV) by exploiting abundant redundant information in both spatial and frequency domains for high-quality image reconstruction. However, the redundant information in FPM remains ambiguous or abstract, which presents challenges to further enhance imaging capabilities and deepen our understanding of the FPM technique. Inspired by Shannon’s information theory and extensive experimental experience in FPM, we defined the specimen complexity and reconstruction algorithm utilization rate and reported a model of redundant information for FPM to predict reconstruction results and guide the optimization of imaging parameters. The model has been validated through extensive simulations and experiments. In addition, it provides a useful tool to evaluate different algorithms, revealing a utilization rate of 24%±1% for the Gauss-Newton algorithm, LED Multiplexing, Wavelength Multiplexing, EPRY-FPM, and GS. In contrast, mPIE exhibits a lower utilization rate of 19%±1%. © 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. |
DOI | 10.1364/OE.505407 |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:001155193000005 |
出版者 | Optica Publishing Group (formerly OSA) |
EI入藏号 | 20235115262618 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/97085 |
专题 | 瞬态光学研究室 |
作者单位 | 1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China; 2.MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Research Center for Space Optics and Astronomy, School of Physics, Xi’an Jiaotong University, Xi’an; 710049, China; 3.University of Chinese Academy of Sciences, Beijing; 100049, China; 4.Division of Advanced Manufacturing, Shenzhen International Graduate School, Tsinghua University, Shenzhen; 518055, China; 5.School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou; 510275, China |
推荐引用方式 GB/T 7714 | Gao, Huiqin,Pan, An,Gao, Yuting,et al. Redundant information model for Fourier ptychographic microscopy[J]. Optics Express,2023,31(26):42822-42837. |
APA | Gao, Huiqin.,Pan, An.,Gao, Yuting.,Zhang, Yu.,Wan, Quanzhen.,...&Yao, Baoli.(2023).Redundant information model for Fourier ptychographic microscopy.Optics Express,31(26),42822-42837. |
MLA | Gao, Huiqin,et al."Redundant information model for Fourier ptychographic microscopy".Optics Express 31.26(2023):42822-42837. |
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文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Redundant informatio(5218KB) | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 |
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