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Redundant information model for Fourier ptychographic microscopy
Gao, Huiqin1,2,3; Pan, An1,3; Gao, Yuting1,3; Zhang, Yu1,4; Wan, Quanzhen1,5; Mu, Tingkui2; Yao, Baoli1,3
作者部门瞬态光学研究室
2023-12-18
发表期刊Optics Express
ISSN10944087
卷号31期号:26页码:42822-42837
产权排序1
摘要

Fourier ptychographic microscopy (FPM) is a computational optical imaging technique that overcomes the traditional trade-off between resolution and field of view (FOV) by exploiting abundant redundant information in both spatial and frequency domains for high-quality image reconstruction. However, the redundant information in FPM remains ambiguous or abstract, which presents challenges to further enhance imaging capabilities and deepen our understanding of the FPM technique. Inspired by Shannon’s information theory and extensive experimental experience in FPM, we defined the specimen complexity and reconstruction algorithm utilization rate and reported a model of redundant information for FPM to predict reconstruction results and guide the optimization of imaging parameters. The model has been validated through extensive simulations and experiments. In addition, it provides a useful tool to evaluate different algorithms, revealing a utilization rate of 24%±1% for the Gauss-Newton algorithm, LED Multiplexing, Wavelength Multiplexing, EPRY-FPM, and GS. In contrast, mPIE exhibits a lower utilization rate of 19%±1%. © 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.

DOI10.1364/OE.505407
收录类别SCI ; EI
语种英语
WOS记录号WOS:001155193000005
出版者Optica Publishing Group (formerly OSA)
EI入藏号20235115262618
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/97085
专题瞬态光学研究室
作者单位1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China;
2.MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Research Center for Space Optics and Astronomy, School of Physics, Xi’an Jiaotong University, Xi’an; 710049, China;
3.University of Chinese Academy of Sciences, Beijing; 100049, China;
4.Division of Advanced Manufacturing, Shenzhen International Graduate School, Tsinghua University, Shenzhen; 518055, China;
5.School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou; 510275, China
推荐引用方式
GB/T 7714
Gao, Huiqin,Pan, An,Gao, Yuting,et al. Redundant information model for Fourier ptychographic microscopy[J]. Optics Express,2023,31(26):42822-42837.
APA Gao, Huiqin.,Pan, An.,Gao, Yuting.,Zhang, Yu.,Wan, Quanzhen.,...&Yao, Baoli.(2023).Redundant information model for Fourier ptychographic microscopy.Optics Express,31(26),42822-42837.
MLA Gao, Huiqin,et al."Redundant information model for Fourier ptychographic microscopy".Optics Express 31.26(2023):42822-42837.
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