One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs

doi:10.1063/5.0005771

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	One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs
	Gao, Guilong 1; He, Kai1 ; Yi, Tao 2; Lv, Meng 3; Yuan, Yun 4; Yan, Xin1 ; Yin, Fei1 ; Li, Shaohui 1; Hu, Ronghao 3; Wang, Tao1 ; Tian, Jinshou1
作者部门	条纹相机工程中心
	2020-04-01
发表期刊	AIP Advances
ISSN	21583226
卷号	10 期号:4
产权排序	1
摘要	An interferometric semiconductor x-ray detection system is proposed in this paper. The system is based on the RadOptic effect, and it utilizes Fabry-Perot interferometry to measure radiation-induced changes in the optical refractive index of a semiconductor (GaAs). In this work, the intrinsic time resolution and the sensitivity of a Fabry-Perot interferometric sensor were systemically studied. Based on the transient free carrier absorption model, the prototype system was established to quantitatively measure the time-dependent x-ray flux with the deconvolution algorithm for the first time. The time resolution of the detection system was approximately 21 ps, and the output signal induced by an x-ray pulse showed a high signal-to-noise ratio and immunity to electromagnetic interference. This interferometer will enable x-ray bang-time and fusion burn-history measurements in inertial confinement fusion with higher time resolution. © 2020 Author(s).
DOI	10.1063/5.0005771
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000527707900003
出版者	American Institute of Physics Inc.
EI入藏号	20201708532559
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.opt.ac.cn/handle/181661/93405
专题	条纹相机工程中心
作者单位	1.Key Laboratory of Ultra-Fast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics (XIOPM, Chinese Academy of Sciences (CAS), Xi'an, Shaanxi; 710119, China; 2.Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan; 621900, China; 3.College of Physics, Sichuan University, Chendu, Sichuan; 610064, China; 4.Rocket Force Academy, Beijing; 100101, China
推荐引用方式 GB/T 7714	Gao, Guilong,He, Kai,Yi, Tao,et al. One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs[J]. AIP Advances,2020,10(4).
APA	Gao, Guilong.,He, Kai.,Yi, Tao.,Lv, Meng.,Yuan, Yun.,...&Tian, Jinshou.(2020).One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs.AIP Advances,10(4).
MLA	Gao, Guilong,et al."One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs".AIP Advances 10.4(2020).

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