Measuring Method and Measuring Device for Optical Gas Measurement

OPT OpenIR > 半导体激光器专利数据库

	Measuring Method and Measuring Device for Optical Gas Measurement
其他题名	Measuring Method and Measuring Device for Optical Gas Measurement
	CHEN, JIA; HANGAUER, ANDREAS; STRZODA, RAINER
	2013-06-27
专利权人	SIEMENS AKTIENGESELLSCHAFT
公开日期	2013-06-27
授权国家	美国
专利类型	发明申请
摘要	An optical gas measurement using a Vertical Cavity Surface-Emitting Laser (VCSEL) and a hollow waveguide connected thereto, wherein the hollow waveguide contains a gas to be measured and conducts light. To this end, the hollow waveguide is made to vibrate. The gas measurement is performed and integrated over a period of time. As a result, disturbances of the measurement caused by interferences are considerably reduced.
其他摘要	使用垂直腔面发射激光器（VCSEL）和与其连接的中空波导的光学气体测量，其中中空波导包含待测量的气体并传导光。为此，使中空波导振动。在一段时间内进行气体测量并进行积分。结果，显着减少了由干扰引起的测量干扰。
申请日期	2010-09-03
专利号	US20130162979A1
专利状态	失效
申请号	US13/394306
公开（公告）号	US20130162979A1
IPC 分类号	G01N21/61
专利代理人	-
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/91592
专题	半导体激光器专利数据库
作者单位	SIEMENS AKTIENGESELLSCHAFT
推荐引用方式 GB/T 7714	CHEN, JIA,HANGAUER, ANDREAS,STRZODA, RAINER. Measuring Method and Measuring Device for Optical Gas Measurement. US20130162979A1[P]. 2013-06-27.