Xi'an Institute of Optics and Precision Mechanics,CAS
Semiconductor laser element and its manufacture | |
其他题名 | Semiconductor laser element and its manufacture |
EGUCHI KAZUHIRO | |
1989-07-10 | |
专利权人 | 株式会社東芝 |
公开日期 | 1989-07-10 |
授权国家 | 日本 |
专利类型 | 发明申请 |
摘要 | PURPOSE:To reduce a series resistance value of a laser element by manufacturing a double-heterojunction semiconductor laser element by using a structure where an InAs layer whose band gap is small is formed as a contact layer and an InAs1-zPz composition transition layer is formed between an InAs contact layer and an InP clad layer. CONSTITUTION:In order to use InAs whose band gap is small as a contact layer 18, the height of a Schottky barrier can be lowered and an impurity of high concentration can be doped. An InAs1-zPz layer 17 is formed between an InP layer 14 and the InAs layer 18, and its composition is changed gradually from InP to InAs; by this setup, the band gap can be changed continuously between InP and InAs; obstruction of a movement of a carrier due to discontinuity of a band is eliminated. In this way, a low-resistance electrode 20 can be formed with reference to a P-type; a series resistance value of a laser element can be lowered. |
其他摘要 | 用途:通过使用其带隙小的InAs层形成为接触层并形成InAs1-zPz组分过渡层的结构,通过制造双异质结半导体激光元件来降低激光元件的串联电阻值在InAs接触层和InP包层之间。组成:为了使用带隙小的InAs作为接触层18,可以降低肖特基势垒的高度,并且可以掺杂高浓度的杂质。在InP层14和InAs层18之间形成InAs1-zPz层17,并且其组成从InP逐渐变为InAs;通过这种设置,可以在InP和InAs之间连续改变带隙;消除了由于带的不连续而妨碍载体移动。以这种方式,可以参考P型形成低电阻电极20;可以降低激光元件的串联电阻值。 |
申请日期 | 1987-12-28 |
专利号 | JP1989173685A |
专利状态 | 失效 |
申请号 | JP1987329989 |
公开(公告)号 | JP1989173685A |
IPC 分类号 | H01L21/205 | H01S5/00 | H01S5/042 | H01S3/18 |
专利代理人 | - |
代理机构 | - |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/89150 |
专题 | 半导体激光器专利数据库 |
作者单位 | 株式会社東芝 |
推荐引用方式 GB/T 7714 | EGUCHI KAZUHIRO. Semiconductor laser element and its manufacture. JP1989173685A[P]. 1989-07-10. |
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