Xi'an Institute of Optics and Precision Mechanics,CAS
Compound semiconductor device | |
其他题名 | Compound semiconductor device |
WATANABE KOJI | |
1989-08-04 | |
专利权人 | MATSUSHITA ELECTRIC IND CO LTD |
公开日期 | 1989-08-04 |
授权国家 | 日本 |
专利类型 | 发明申请 |
摘要 | PURPOSE:To stabilize in a heat treatment by doping electrically inactive V or VII group element as an impurity at III-V compound semiconductor containing group II element as an impurity. CONSTITUTION:An N type InGaAs layer 2 is grown by an epitaxial technique, such as MBE on a semi-insulating InP substrate 1 in a InP-InGaAs hetero bipolar transistor, an N-type InGaAs layer 3 is then grown, As or F is, for example, doped thereon to sequentially form a Be-doped P-type InGaAs layer 24 having 5X10cm of carrier concentration thereon, further an N-type InP layer 5 having 2X10cm of carrier concentration and then an N type nGaAs layer 6 having 1X10cm of carrier concentration. After the Be ions are selectively implanted, it is heat treated to form a P type InGaAs region 10. An emitter electrode 7 and a collector electrode 8 are formed of AuGe, and a base electrode 9 is formed of AuZn. In the thus obtained bipolar transistor, the diffusion of group II element from the layer 4 is suppressed by the As of the V group element or the F of the VII group element, and the deterioration of electron implanting efficiency is suppressed. Accordingly, an emitter grounded current amplification factor is improved. |
其他摘要 | 用途:通过在含有II族元素的III-V族化合物半导体作为杂质掺杂电惰性V或VII族元素作为杂质来稳定热处理。组成:N +型InGaAs层2通过外延技术生长,如MBE在InP-InGaAs异质双极晶体管的半绝缘InP衬底1,然后生长N型InGaAs层3,As或者,例如,在其上掺杂F,以依次形成其上具有5×10 18 cm -3载流子浓度的Be掺杂P型InGaAs层24,进一步具有2×10 17的N型InP层5。载流子浓度为cm -3,然后是载流子浓度为1×10 19 cm -3的N +型nGaAs层6。在选择性地注入Be离子之后,对其进行热处理以形成P +型InGaAs区域10.发射极电极7和集电极电极8由AuGe形成,基极电极9由AuZn形成。在如此获得的双极晶体管中,II族元素从层4的扩散被V族元素的As或VII族元素的F抑制,并且抑制了电子注入效率的劣化。因此,改善了发射极接地电流放大系数。 |
申请日期 | 1988-01-29 |
专利号 | JP1989194469A |
专利状态 | 失效 |
申请号 | JP1988020486 |
公开(公告)号 | JP1989194469A |
IPC 分类号 | H01L29/73 | H01L21/20 | H01L21/331 | H01L21/338 | H01L29/205 | H01L29/72 | H01L29/737 | H01L29/778 | H01L29/80 | H01L29/812 | H01S5/00 | H01S3/18 |
专利代理人 | - |
代理机构 | - |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/83250 |
专题 | 半导体激光器专利数据库 |
作者单位 | MATSUSHITA ELECTRIC IND CO LTD |
推荐引用方式 GB/T 7714 | WATANABE KOJI. Compound semiconductor device. JP1989194469A[P]. 1989-08-04. |
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