Measurement apparatus for semiconductor laser

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	Measurement apparatus for semiconductor laser
其他题名	Measurement apparatus for semiconductor laser
	SEKO ICHIRO; MATSUMURA HIROYOSHI
	1986-11-05
专利权人	HITACHI LTD
公开日期	1986-11-05
授权国家	日本
专利类型	发明申请
摘要	PURPOSE:To select a semiconductor laser which has a high coupling efficiency with an optical fiber with a high yield only by measuring a light power transmitted through a Gaussian distribution filter inserted between the semiconductor laser and a detector. CONSTITUTION:Only a Gaussian component of a laser beam of a semiconductor laser is taken out by inserting a Gaussian distribution filter into a measurement apparatus. For instance, the apparatus consists of a semiconductor laser 1, a Gaussian distribution filter 2 and a detector 3. If necessary, a lens 4 may be inserted between (1) and (2) or between (2) and (3). The Gaussian distribution filter is produced in such a manner that a portion 6 whose refractive index is 4702 and radius is 28.8mum is formed at the center part of a glass plate 5 whose refractive index is 4701 by ion exchange. Then, in order to make the numerical aperture of the Gaussian filter agree with the numerical aperture of an optical fiber (NA=0.1), a metal film 7 is evaporated on the surface of the filter and a circular window which forms concentric circles with the center part 6 of the glass and has a radius of 50mum is formed in the metal film 7. The distance from the semiconductor laser 1 to the surface of the Gaussian distribution filter 2 is 500mum.
其他摘要	目的：仅通过测量通过插入半导体激光器和探测器之间的高斯分布滤光器传输的光功率，选择具有高光耦合效率的半导体激光器。组成：通过将高斯分布滤波器插入测量设备，只取出半导体激光器的激光束的高斯分量。例如，该装置包括半导体激光器1，高斯分布滤波器2和检测器3.如果需要，可以在（1）和（2）之间或（2）和（3）之间插入透镜4。以如下方式制造高斯分布滤光器：通过离子交换在折射率为4701的玻璃板5的中心部分形成折射率为4702且半径为28.8μm的部分6。然后，为了使高斯滤波器的数值孔径与光纤的数值孔径（NA = 0.1）一致，金属膜7在滤光器的表面上蒸发，并且圆形窗口与其形成同心圆。在金属膜7中形成玻璃的中心部分6并且半径为50μm。从半导体激光器1到高斯分布滤光器2的表面的距离是500μm。
主权项	-
申请日期	1985-04-26
专利号	JP1986248490A
专利状态	失效
申请号	JP1985088568
公开（公告）号	JP1986248490A
IPC 分类号	H01S5/00 \| H01L21/66 \| H01S3/18
专利代理人	-
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/62981
专题	半导体激光器专利数据库
作者单位	HITACHI LTD
推荐引用方式 GB/T 7714	SEKO ICHIRO,MATSUMURA HIROYOSHI. Measurement apparatus for semiconductor laser. JP1986248490A[P]. 1986-11-05.

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