High-speed measuring system for semiconductor laser characteristic

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	High-speed measuring system for semiconductor laser characteristic
其他题名	High-speed measuring system for semiconductor laser characteristic
	NOZAKI GAKUO
	1991-03-07
专利权人	NEC CORP
公开日期	1991-03-07
授权国家	日本
专利类型	发明申请
摘要	PURPOSE:To decide whether the characteristic is good or not by subjecting an optical output power characteristic curve to polar coordinate transformation and dividing it to blocks and extracting a straight line passing the largest number of points and calculating the absolute value of the difference between this straight line and the optical output power. CONSTITUTION:A current driving part 1 generates a driving current (a) to cause a differentiating circuit 2 to output a differential current (b) and to cause a semiconductor laser 3 to output an optical power (c). The optical power (c) is inputted to an optical signal measuring circuit 4 and this circuit 4 generates an optical power signal (d), and the signal (d) and the current (b) are inputted to an A/D converting circuit 5 and this circuit 5 outputs a two-dimensional data signal (e) to a microprocessor (MP) 6. The MP 6 divides curve data obtained by polar coordinate transformation of the differential current-optical power output characteristic into blocks and executes the parallel operation to quickly extract the inclination of the straight line and calculates the disturbance of the differential I-L characteristic waveform based on this decided straight line data and compares it with the waveform standard and discriminates whether it is good or not.
其他摘要	目的：通过对光学输出功率特性曲线进行极坐标变换并将其划分为块并提取通过最大点数的直线并计算该直线之差的绝对值来判断特性是否良好。线和光输出功率。组成：电流驱动部分1产生驱动电流（a），使差分电路2输出差分电流（b），并使半导体激光器3输出光功率（c）。光功率（c）输入到光信号测量电路4，该电路4产生光功率信号（d），信号（d）和电流（b）输入到A / D转换电路5。该电路5将二维数据信号（e）输出到微处理器（MP）6.MP6将通过差分电流 - 光功率输出特性的极坐标变换获得的曲线数据分成块，并执行并行操作。快速提取直线的倾斜度，并根据该确定的直线数据计算差分IL特性波形的干扰，并将其与波形标准进行比较，并判断其是否良好。
主权项	-
申请日期	1989-07-21
专利号	JP1991053132A
专利状态	失效
申请号	JP1989189448
公开（公告）号	JP1991053132A
IPC 分类号	G01J1/00 \| H01S5/00 \| H01S3/18
专利代理人	-
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/62624
专题	半导体激光器专利数据库
作者单位	NEC CORP
推荐引用方式 GB/T 7714	NOZAKI GAKUO. High-speed measuring system for semiconductor laser characteristic. JP1991053132A[P]. 1991-03-07.

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