Xi'an Institute of Optics and Precision Mechanics,CAS
Measuring instrument for semiconductor laser characteristics | |
其他题名 | Measuring instrument for semiconductor laser characteristics |
SAITO TETSUO; MURASAWA YOSHIHIRO; KUGE TSUKASA | |
1988-08-12 | |
专利权人 | CANON INC |
公开日期 | 1988-08-12 |
授权国家 | 日本 |
专利类型 | 发明申请 |
摘要 | PURPOSE:To accurately and easily measure the far field pattern characteristics of a semiconductor laser by positioning the semiconductor laser and a photodetector optically. CONSTITUTION:A measuring instrument capable of measuring the far field pattern characteristics of the laser detects position shifts between semiconductor lasers 1-3 and a photodetector (photosensor) 4. Then the semiconductor lasers 1-3 are positioned by being moved in a 1st or 2nd direction in hetero-junction surfaces of the semiconductor lasers 1-3 relatively to the photosensor 4. Then, while the photosensor 4 rotated around 1st and 2nd directions relatively to the semiconductor lasers 1-3, a rotational angle-light quantity distribution is measured. Data regarding respective measured characteristics are processed properly and statistically together with temperature conditions and outputted on a CRT. Consequently, the far field pattern characteristics of the semiconductor lasers can be measured. |
其他摘要 | 目的:通过光学定位半导体激光器和光电探测器,准确,轻松地测量半导体激光器的远场模式特性。组成:一个能够测量激光远场模式特征的测量仪器检测半导体激光器1-3和光电探测器(光电传感器)4之间的位置偏移。然后半导体激光器1-3通过在第一或第二移动定位半导体激光器1-3的异质结表面中的相对于光电传感器4的方向。然后,当光电传感器4相对于半导体激光器1-3绕第一和第二方向旋转时,测量旋转角 - 光量分布。关于各个测量特性的数据与温度条件一起被适当地和统计地处理并且在CRT上输出。因此,可以测量半导体激光器的远场图案特性。 |
主权项 | - |
申请日期 | 1987-02-10 |
专利号 | JP1988195538A |
专利状态 | 失效 |
申请号 | JP1987027207 |
公开(公告)号 | JP1988195538A |
IPC 分类号 | G01J1/00 | G01J1/42 | G01M11/00 | H01S5/00 | H01S3/18 |
专利代理人 | - |
代理机构 | - |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/62608 |
专题 | 半导体激光器专利数据库 |
作者单位 | CANON INC |
推荐引用方式 GB/T 7714 | SAITO TETSUO,MURASAWA YOSHIHIRO,KUGE TSUKASA. Measuring instrument for semiconductor laser characteristics. JP1988195538A[P]. 1988-08-12. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
JP1988195538A.PDF(420KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
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