Automated monitoring system, virtual oven and method for stress testing logically grouped modules

OPT OpenIR > 半导体激光器专利数据库

	Automated monitoring system, virtual oven and method for stress testing logically grouped modules
其他题名	Automated monitoring system, virtual oven and method for stress testing logically grouped modules
	FLOYD JOHN; DAR IQBAL; OBRADOVIC MILA; HUMBERSON JEROME
	2002-07-18
专利权人	CIENA CORPORATION
公开日期	2002-07-18
授权国家	世界知识产权组织
专利类型	发明申请
摘要	A virtual oven includes a logical grouping of modules, a controller, test instruments and a database which are all connected via a network. The logical groupings of modules of several virtual ovens may be physically accommodated within a single environmental stress screening room. Switching between modules in a logical group permits a single test piece of test equipment to be time-shared among the modules in the logical group. The method of burn-in testing a logical group of modules rotates a test sequence, including passive and active test cycles, between the modules. A test signal is split and supplied to multiple modules. Passive testing may be perfomred by monitoring parameters of the module while the test signal is supplied to the module. Active testing may be a functional test of the module in which the test signal is supplied to, processed by, and output from the module. Such test signals output from the modules are switched to the test equipment on a time-share basis. In this way, the number or expensive test equipment set-ups may reduced.
其他摘要	虚拟烤箱包括模块的逻辑分组，控制器，测试仪器和数据库，它们都通过网络连接。几个虚拟烤箱的模块的逻辑分组可以物理地容纳在单个环境压力筛选室内。在逻辑组中的模块之间切换允许单个测试设备的测试设备在逻辑组中的模块之间分时。老化测试逻辑模块组的方法在模块之间旋转测试序列，包括被动和主动测试循环。测试信号被分离并提供给多个模块。当测试信号提供给模块时，可以通过监视模块的参数来执行被动测试。有源测试可以是模块的功能测试，其中测试信号被提供给模块，由模块处理和从模块输出。从模块输出的这种测试信号在时间分享的基础上切换到测试设备。通过这种方式，可以减少数量或昂贵的测试设备设置。
主权项	A virtual oven for stress testing a plurality of modules, comprising: a logical group of modules loaded into an environmental stress screening room wherein an environmental stress parameter of the environmental stress screening room changes over time; a test equipment operatively connected to the modules of said logical group, said test equipment generating a test signal and capable of performing an active test of at least one of the modules of said logical group at a time ; and a controller operatively connected to said test equipment and to said logical group of modules; said controller receiving results of the active test performed by said test equipment.
申请日期	2001-10-11
专利号	WO2002031519A3
专利状态	未确认
申请号	PCT/US2001/031762
公开（公告）号	WO2002031519A3
IPC 分类号	G01R31/28 \| G05B23/02 \| G01R31/316
专利代理人	MICHAEL R. CAMMARATA, CIENA CORPORATION, LEGA DEPARTMENT, 1201 WINTERSON ROAD, LINTHICUM, MD 21090, US
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/62473
专题	半导体激光器专利数据库
作者单位	CIENA CORPORATION
推荐引用方式 GB/T 7714	FLOYD JOHN,DAR IQBAL,OBRADOVIC MILA,et al. Automated monitoring system, virtual oven and method for stress testing logically grouped modules. WO2002031519A3[P]. 2002-07-18.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
WO2002031519A3.PDF（198KB）	专利		开放获取	CC BY-NC-SA	请求全文