Methods and apparatus for analysing light waveguide couplers

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	Methods and apparatus for analysing light waveguide couplers
其他题名	Methods and apparatus for analysing light waveguide couplers
	ALEGRIA, CARLOS, C/O CTRE FOR ENTERPRISE & INNOV.; ZERVAS, MIKHAIL NICKOLAOS, CTRE.FOR ENTERPR.INNOV.
	2003-02-26
专利权人	UNIVERSITY OF SOUTHAMPTON
公开日期	2003-02-26
授权国家	欧洲专利局
专利类型	发明申请
摘要	Methods for analysing waveguide couplers are non-destructive, and comprise introducing probe light into a coupler; providing a source of perturbing radiation; presenting the coupling region of the coupler to the perturbing radiation to generate a temperature gradient across the waveguide, either from a direction so as to expose one waveguide before another waveguide and perturb the coupling region asymmetrically, or from a direction so as to expose the waveguides together and perturb the coupling region symmetrically; monitoring the power and/or phase of transmitted probe light, and repeating the presenting and monitoring along the length of the coupling region. Theoretical modelling shows that the transmitted probe light contains information from which can be derived the coupling profile, and power evolution and distribution along the coupling region, including location of the 50-50% points.
其他摘要	用于分析波导耦合器的方法是非破坏性的，并且包括将探测光引入耦合器中;提供扰动辐射源;将耦合器的耦合区域呈现为扰动辐射，以在一个方向上产生横跨波导的温度梯度，以便在另一个波导之前暴露一个波导并且不对称地扰动耦合区域，或者从一个方向产生温度梯度以暴露波导一起对称地扰动耦合区域;监测发射的探测光的功率和/或相位，并沿耦合区域的长度重复呈现和监测。理论建模表明，传输的探测光包含的信息可以从耦合剖面得到，以及沿耦合区域的功率演变和分布，包括50-50％点的位置。
主权项	A method of analysing a waveguide coupler having a coupling region with axial length and comprising first and second waveguides extending side-by-side, the method comprising: introducing probe light into the coupler; providing a source of perturbing radiation having a direction of incidence onto the coupling region; generating a temperature gradient across the coupling region by arranging the first and second waveguides in line with the direction of incidence of the perturbing radiation, thereby to perturb the coupling region asymmetrically; monitoring the probe light transmitted by the coupler; and repeating the generating and monitoring steps for a sequence of axial length portions of the coupling region.
申请日期	2001-08-14
专利号	EP1286149A1
专利状态	失效
申请号	EP2001306893
公开（公告）号	EP1286149A1
IPC 分类号	G01M11/00 \| G02B6/28
专利代理人	-
代理机构	HAINES, MILES JOHN
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/52521
专题	半导体激光器专利数据库
作者单位	UNIVERSITY OF SOUTHAMPTON
推荐引用方式 GB/T 7714	ALEGRIA, CARLOS, C/O CTRE FOR ENTERPRISE & INNOV.,ZERVAS, MIKHAIL NICKOLAOS, CTRE.FOR ENTERPR.INNOV.. Methods and apparatus for analysing light waveguide couplers. EP1286149A1[P]. 2003-02-26.