Xi'an Institute of Optics and Precision Mechanics,CAS
Spectroscopic system using surface emission laser | |
其他题名 | Spectroscopic system using surface emission laser |
REGINA, BEST-TIMMANN; PETER, DREYER | |
1996-02-21 | |
专利权人 | DRAEGERWERK AKTIENGESELLSCHAFT |
公开日期 | 1996-02-21 |
授权国家 | 英国 |
专利类型 | 发明申请 |
摘要 | A radiation source (1) for a measuring system for the spectroscopic analysis of the proportion of a material in a gas sample is to be improved with regard to its capacity for tuning in the wave length range which is used for the gas analysis. In order to achieve this object, the radiation source is constructed as a laser diode (2) which is located on a planar substrate (8) and emits in a vertical manner in respect of the substrate (8). The emission wavelength of the laser diode is controlled using a thermoelectric peltier cooling device. |
其他摘要 | 用于气体样品中材料比例的光谱分析的测量系统的辐射源(1)将在其用于气体分析的波长范围内调节的能力方面得到改进。为了实现该目的,辐射源被构造为激光二极管(2),其位于平面基板(8)上并且相对于基板(8)以垂直方式发射。使用热电珀耳帖冷却装置控制激光二极管的发射波长。 |
主权项 | A radiation source for a measuring system for the spectroscopic analysis of the proportion of a material in a gas sample, having at least one tempering device for adjusting the temperature-operating point of the radiation source, wherein the radiation source is a laser diode which is located on a planar substrate and is able to emit in a vertical or substantially vertical manner with respect to the substrate. |
申请日期 | 1995-08-16 |
专利号 | GB2292479A |
专利状态 | 失效 |
申请号 | GB1995016803 |
公开(公告)号 | GB2292479A |
IPC 分类号 | G01N21/39 | H01S5/06 | H01S5/022 | H01S5/00 | G01N21/31 | H01S5/183 | H01S3/103 |
专利代理人 | - |
代理机构 | - |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/50979 |
专题 | 半导体激光器专利数据库 |
作者单位 | DRAEGERWERK AKTIENGESELLSCHAFT |
推荐引用方式 GB/T 7714 | REGINA, BEST-TIMMANN,PETER, DREYER. Spectroscopic system using surface emission laser. GB2292479A[P]. 1996-02-21. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
GB2292479A.PDF(408KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
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