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Spectroscopic system using surface emission laser
其他题名Spectroscopic system using surface emission laser
REGINA, BEST-TIMMANN; PETER, DREYER
1996-02-21
专利权人DRAEGERWERK AKTIENGESELLSCHAFT
公开日期1996-02-21
授权国家英国
专利类型发明申请
摘要A radiation source (1) for a measuring system for the spectroscopic analysis of the proportion of a material in a gas sample is to be improved with regard to its capacity for tuning in the wave length range which is used for the gas analysis. In order to achieve this object, the radiation source is constructed as a laser diode (2) which is located on a planar substrate (8) and emits in a vertical manner in respect of the substrate (8). The emission wavelength of the laser diode is controlled using a thermoelectric peltier cooling device.
其他摘要用于气体样品中材料比例的光谱分析的测量系统的辐射源(1)将在其用于气体分析的波长范围内调节的能力方面得到改进。为了实现该目的,辐射源被构造为激光二极管(2),其位于平面基板(8)上并且相对于基板(8)以垂直方式发射。使用热电珀耳帖冷却装置控制激光二极管的发射波长。
主权项A radiation source for a measuring system for the spectroscopic analysis of the proportion of a material in a gas sample, having at least one tempering device for adjusting the temperature-operating point of the radiation source, wherein the radiation source is a laser diode which is located on a planar substrate and is able to emit in a vertical or substantially vertical manner with respect to the substrate.
申请日期1995-08-16
专利号GB2292479A
专利状态失效
申请号GB1995016803
公开(公告)号GB2292479A
IPC 分类号G01N21/39 | H01S5/06 | H01S5/022 | H01S5/00 | G01N21/31 | H01S5/183 | H01S3/103
专利代理人-
代理机构-
文献类型专利
条目标识符http://ir.opt.ac.cn/handle/181661/50979
专题半导体激光器专利数据库
作者单位DRAEGERWERK AKTIENGESELLSCHAFT
推荐引用方式
GB/T 7714
REGINA, BEST-TIMMANN,PETER, DREYER. Spectroscopic system using surface emission laser. GB2292479A[P]. 1996-02-21.
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