Xi'an Institute of Optics and Precision Mechanics,CAS
Method and apparatus for measuring gas concentration using a semiconductor laser | |
其他题名 | Method and apparatus for measuring gas concentration using a semiconductor laser |
WALKER, STEPHEN D.; NICHOLS, ROBERT A.; CURNAN, WILLIAM A.; SVAI, SOPHAT; BRAIG, JAMES R.; GOLDBERGER, DANIEL S. | |
2000-07-18 | |
专利权人 | UDT SENSORS, INC. |
公开日期 | 2000-07-18 |
授权国家 | 美国 |
专利类型 | 授权发明 |
摘要 | A system and method for determining the concentration of an analyte such as oxygen in an unknown gas sample. A Vertical Cavity Surface Emitting Laser (VCSEL) is used as a variable wavelength light source which is "swept" through a wavelength range by varying the drive signal applied thereto. Quantitative spectroscopic analysis of the unknown gas sample is performed without the requirement of feedback circuitry for tuning the light source to the characteristic frequency of an analyte. Instead, the VCSEL is repeatedly "swept" through a range of frequencies determined by the drive signal, and the absorption is measured by the detector. The absorption lines do not always occur at the same place but instead move along around during the sweep based on the temperature and baseline current. The absorption at a particular wavelength may be determined by overlaying the drive signal and its timing information over the detected absorption signal. |
其他摘要 | 一种用于确定未知气体样品中的分析物(例如氧)浓度的系统和方法。垂直腔面发射激光器(VCSEL)用作可变波长光源,其通过改变施加到其上的驱动信号而“扫过”波长范围。在不需要反馈电路的情况下进行未知气体样品的定量光谱分析,以将光源调谐到分析物的特征频率。相反,VCSEL通过由驱动信号确定的频率范围重复“扫描”,并且检测器测量吸收。吸收线并不总是出现在相同的位置,而是基于温度和基线电流在扫描期间沿着周围移动。可以通过在检测到的吸收信号上叠加驱动信号及其定时信息来确定特定波长的吸收。 |
申请日期 | 1998-05-21 |
专利号 | US6091504 |
专利状态 | 失效 |
申请号 | US09/082662 |
公开(公告)号 | US6091504 |
IPC 分类号 | G01N21/31 | G01N21/39 | G01N21/00 |
专利代理人 | - |
代理机构 | WOODCOCK WASHBURN KURTZ MACKIEWICZ & NORRIS LLP |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/49078 |
专题 | 半导体激光器专利数据库 |
作者单位 | UDT SENSORS, INC. |
推荐引用方式 GB/T 7714 | WALKER, STEPHEN D.,NICHOLS, ROBERT A.,CURNAN, WILLIAM A.,et al. Method and apparatus for measuring gas concentration using a semiconductor laser. US6091504[P]. 2000-07-18. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
US6091504.PDF(186KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论