Purging: a reliability assurance technique for semiconductor lasers utilizing a purging process

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	Purging: a reliability assurance technique for semiconductor lasers utilizing a purging process
其他题名	Purging: a reliability assurance technique for semiconductor lasers utilizing a purging process
	GORDON, EUGENE I.; HARTMAN, ROBERT L.; NASH, FRANKLIN R.
	1986-03-04
专利权人	BELL TELEPHONE LABORATORES, INCORPORATED A CORP. OF NY
公开日期	1986-03-04
授权国家	美国
专利类型	授权发明
摘要	Prior to packaging, semiconductor lasers are purged by being subjected first to high temperature and high current simultaneously so as to suppress stimulated emission and stress the shunt paths which allow leakage current to flow around the active region. A prudent, but nonessential, second step is to lower the temperature and/or current so that the lasers emit stimulated emission (preferably strongly, near the peak output power), thereby stressing the active region. Lasers subjected to such a purge exhibit stabilized degradation rates in short times (of the order of a few hours) and provide a robust population which meets the performance criteria of long lifetime systems.
其他摘要	在封装之前，通过首先经受高温和高电流来清除半导体激光器，以便抑制受激发射并对分流路径施加应力，这允许漏电流在有源区域周围流动。谨慎但非必要的第二步是降低温度和/或电流，使得激光器发射受激发射（优选强烈地，接近峰值输出功率），从而对有源区施加应力。经受这种吹扫的激光器在短时间内（几小时的数量级）表现出稳定的降解速率，并且提供了满足长寿命系统的性能标准的稳健的群体。
主权项	A method of manufacturing semiconductor lasers, which includes screening lasers relative to predetermined performance criteria, comprising the steps of: (a) subjecting each of said lasers to a first temperature T.sub.1, (b) applying terminal current I.sub.1 to each of said lasers such that the combination of said current I.sub.1 and temperature T.sub.1 is sufficiently high that said lasers emit virtually no stimulated emission, (c) continuing steps (a) and (b) concurrently for a time period t.sub.1, (d) measuring an electrical and/or optical characteristic of said lasers so as to separate those which meet predetermined performance criteria from those which do not.
申请日期	1984-03-22
专利号	US4573255
专利状态	失效
申请号	US06/592285
公开（公告）号	US4573255
IPC 分类号	H01S5/00 \| H01S5/223 \| H01S5/227 \| H01S5/24 \| H01L21/66
专利代理人	-
代理机构	URBANO, MICHAEL J.
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/46268
专题	半导体激光器专利数据库
作者单位	BELL TELEPHONE LABORATORES, INCORPORATED A CORP. OF NY
推荐引用方式 GB/T 7714	GORDON, EUGENE I.,HARTMAN, ROBERT L.,NASH, FRANKLIN R.. Purging: a reliability assurance technique for semiconductor lasers utilizing a purging process. US4573255[P]. 1986-03-04.

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