Xi'an Institute of Optics and Precision Mechanics,CAS
Group III nitride semiconductor light emitting device and method of fabricating group III nitride semiconductor light emitting device | |
其他题名 | Group III nitride semiconductor light emitting device and method of fabricating group III nitride semiconductor light emitting device |
YONEMURA, TAKUMI; KYONO, TAKASHI; ENYA, YOHEI | |
2014-10-28 | |
专利权人 | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
公开日期 | 2014-10-28 |
授权国家 | 美国 |
专利类型 | 授权发明 |
摘要 | A group III nitride semiconductor light emitting device includes an n-type cladding layer and a p-type cladding layer on a primary surface of a substrate, the c-axes of which tilt relative to the normal axis of the primary surface of the substrate. The p-type cladding layer is doped with a p-type dopant providing an acceptor level, and the p-type cladding layer contains an n-type impurity providing a donor level. An active layer is disposed between the n-type cladding layer and the p-type cladding layer. The concentration of the p-type dopant is greater than that of the n-type impurity. The difference (E(BAND)−E(DAP)) between the energy E(BAND) of a band-edge emission peak value in the photoluminescence spectrum of the p-type cladding layer and the energy E(DAP) of a donor-acceptor pair emission peak value in the photoluminescence spectrum is not more than 0.42 electron volts. |
其他摘要 | III族氮化物半导体发光器件包括在基板的主表面上的n型包覆层和p型包覆层,其c轴相对于基板的主表面的法线轴倾斜。 p型包覆层掺杂有提供受主能级的p型掺杂剂,并且p型包覆层包含提供施主能级的n型杂质。有源层设置在n型包覆层和p型包覆层之间。 p型掺杂剂的浓度大于n型杂质的浓度。 p型包层的光致发光光谱中的带边发射峰值的能量E(BAND)与供体的能量E(DAP)之间的差值(E(BAND)-E(DAP)) - 光致发光光谱中的受体对发射峰值不大于0.42电子伏特。 |
授权日期 | 2014-10-28 |
申请日期 | 2012-04-23 |
专利号 | US8872156 |
专利状态 | 授权 |
申请号 | US13/453718 |
公开(公告)号 | US8872156 |
IPC 分类号 | H01S5/32 | H01L29/20 | H01L21/02 | H01S5/20 | H01L31/352 | H01L33/16 | H01S5/30 | H01S5/343 | H01L29/78 | H01L33/32 | H01L29/16 | H01S5/042 | H01L31/0352 | H01L29/872 | H01S5/00 |
专利代理人 | SARTORI, MICHAEL A. | RIGGS, F. BROCK |
代理机构 | VENABLE LLP |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/39745 |
专题 | 半导体激光器专利数据库 |
作者单位 | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
推荐引用方式 GB/T 7714 | YONEMURA, TAKUMI,KYONO, TAKASHI,ENYA, YOHEI. Group III nitride semiconductor light emitting device and method of fabricating group III nitride semiconductor light emitting device. US8872156[P]. 2014-10-28. |
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US8872156.PDF(1730KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
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