Method and apparatus for identifying the position of two groups of light waveguides to be aligned

OPT OpenIR > 半导体激光器专利数据库

	Method and apparatus for identifying the position of two groups of light waveguides to be aligned
其他题名	Method and apparatus for identifying the position of two groups of light waveguides to be aligned
	LIEBER, WINFRIED
	1995-01-24
专利权人	SIEMENS AKTIENGESELLSCHAFT
公开日期	1995-01-24
授权国家	美国
专利类型	授权发明
摘要	For identifying the local distribution of light waveguides in two groups to be aligned to one another, the groups are displaced at least once relative to one another transversely relative to the longitudinal axes of the light waveguides to be investigated in at least one plane. The chronological curve of the intensity distribution of the light coupled from the one group into the other group during the displacement is identified and evaluated. For optimally aligning the waveguides with two groups, an intensity distribution for each group is obtained and the distributions are compared to find an alignment which produces a maximum overlap. A splicing operation may be then conducted with the groups thus aligned, and the same technique can then be used to control the splicing as well as to check the quality of the splice.
其他摘要	为了识别两组中的光波导的局部分布以彼此对准，这些组相对于彼此横向地相对于待在至少一个平面中研究的光波导的纵向轴线移位至少一次。识别和评估在位移期间从一组耦合到另一组的光的强度分布的时间顺序曲线。为了使波导与两组最佳对准，获得每组的强度分布，并比较分布以找到产生最大重叠的对准。然后可以用这样对齐的组进行拼接操作，然后可以使用相同的技术来控制拼接以及检查拼接的质量。
授权日期	1995-01-24
申请日期	1993-08-02
专利号	US5384870
专利状态	失效
申请号	US08/100244
公开（公告）号	US5384870
IPC 分类号	G02B6/255 \| G01B11/00 \| G02B6/24 \| G02B6/26
专利代理人	-
代理机构	HILL,STEADMAN & SIMPSON
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/36157
专题	半导体激光器专利数据库
作者单位	SIEMENS AKTIENGESELLSCHAFT
推荐引用方式 GB/T 7714	LIEBER, WINFRIED. Method and apparatus for identifying the position of two groups of light waveguides to be aligned. US5384870[P]. 1995-01-24.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
US5384870.PDF（2005KB）	专利		开放获取	CC BY-NC-SA	请求全文