Xi'an Institute of Optics and Precision Mechanics,CAS
Photo-detector and photo-detection method using the same | |
其他题名 | Photo-detector and photo-detection method using the same |
SHIMIZU, AKIRA; FUJII, KAZUHITO | |
1994-02-08 | |
专利权人 | CANON KABUSHIKI KAISHA 30-2, 3-CHOME, SHIMOMARUKO, OHTA-KU, TOKYO, JAPAN, A CORP. OF JAPAN |
公开日期 | 1994-02-08 |
授权国家 | 美国 |
专利类型 | 授权发明 |
摘要 | A photo-detector for detecting a light having a predetermined photon energy, comprises: a semiconductor member having a source region, a gate region and a drain region; a first path for propagating an electron wave from the source region to the drain region through the gate region; a second path for propagating an electron wave from the source region to the drain region through the gate region; the second path being of quantum well structure or a quantum line structure and having a plurality of electron levels having an energy difference therebetween slightly smaller or slightly larger than the photon energy of the light to be detected; a wave function of the electron wave propagating through the second path being coupled with a wave function of the electron wave propagating through the first path in the source region and the drain region and separated from the wave function of the electron wave propagating through the first path in the gate region; means for applying a voltage across the source region and the drain region; means for detecting a current flowing across the source region and the drain region. When the light to be detected is applied to the second path, the electron levels are shifted by an optical Stark effect and phase difference is created between the electron wave propagating through the first path and the electron wave propagating through the second path so that the current changes. |
其他摘要 | 一种用于检测具有预定光子能量的光的光检测器,包括:半导体构件,具有源区,栅区和漏区;用于通过栅极区域将电子波从源极区域传播到漏极区域的第一路径;用于通过栅极区域将电子波从源极区域传播到漏极区域的第二路径;第二路径是量子阱结构或量子线结构,并且具有多个电子能级,其间的能量差略小于或略大于待检测光的光子能量;通过第二路径传播的电子波的波函数与通过源区和漏区中的第一路径传播的电子波的波函数耦合,并与通过第一路径传播的电子波的波函数分离在门区;用于在源区和漏区上施加电压的装置;用于检测流过源区和漏区的电流的装置。当要检测的光被施加到第二路径时,电子能级通过光学斯塔克效应移位,并且在通过第一路径传播的电子波和通过第二路径传播的电子波之间产生相位差,使得电流变化。 |
申请日期 | 1991-02-25 |
专利号 | US5285068 |
专利状态 | 失效 |
申请号 | US07/660027 |
公开(公告)号 | US5285068 |
IPC 分类号 | H01L31/0352 | H01L31/0248 | H01L31/08 | H01S5/10 | H01S5/00 | H01S5/062 | G01J1/02 | H01L31/0264 | H01L31/10 | H01L27/14 | G01J5/20 |
专利代理人 | - |
代理机构 | FITZPATRICK,CELLA,HARPER & SCINTO |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/34940 |
专题 | 半导体激光器专利数据库 |
作者单位 | CANON KABUSHIKI KAISHA 30-2, 3-CHOME, SHIMOMARUKO, OHTA-KU, TOKYO, JAPAN, A CORP. OF JAPAN |
推荐引用方式 GB/T 7714 | SHIMIZU, AKIRA,FUJII, KAZUHITO. Photo-detector and photo-detection method using the same. US5285068[P]. 1994-02-08. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
US5285068.PDF(832KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论