Method for measuring the lifetime of an excited state in a sample

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	Method for measuring the lifetime of an excited state in a sample
其他题名	Method for measuring the lifetime of an excited state in a sample
	WIDZGOWSKI, BERND
	2018-09-11
专利权人	LEICA MICROSYSTEMS CMS GMBH
公开日期	2018-09-11
授权国家	美国
专利类型	授权发明
摘要	The present invention relates to a method for measuring the lifetime of an excited state in a sample, in particular a fluorescence lifetime, and to an apparatus for carrying out such a method. First, an excitation pulse is generated and a sample region is illuminated with the excitation pulse. Then, a first digital data sequence is generated which is representative of the power-time profile of the excitation pulse, and a first switching instant is determined from the first digital data sequence. Moreover, the detection light emanating from the sample region is detected by a detector, and a second digital data sequence is generated which is representative of the power-time profile of the detection light, and a second switching instant is determined from the second digital data sequence. Finally, the time difference between the first and second switching instants is calculated.
其他摘要	本发明涉及测量样品中激发态寿命，特别是荧光寿命的方法，以及实施这种方法的装置。首先，产生激励脉冲并用激发脉冲照射样本区域。然后，产生第一数字数据序列，其表示激励脉冲的功率 - 时间曲线，并且从第一数字数据序列确定第一切换时刻。此外，由检测器检测从样本区域发出的检测光，并且生成表示检测光的功率 - 时间分布的第二数字数据序列，并且从第二数字数据确定第二切换时刻。序列。最后，计算第一和第二切换瞬间之间的时间差。
申请日期	2012-11-14
专利号	US10073034
专利状态	授权
申请号	US13/676408
公开（公告）号	US10073034
IPC 分类号	G01J1/58 \| G01N21/64
专利代理人	-
代理机构	PATENTBAR INTERNATIONAL, P.C.
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/34528
专题	半导体激光器专利数据库
作者单位	LEICA MICROSYSTEMS CMS GMBH
推荐引用方式 GB/T 7714	WIDZGOWSKI, BERND. Method for measuring the lifetime of an excited state in a sample. US10073034[P]. 2018-09-11.

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