Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy | |
Bai, Chen; Liu, Chao; Jia, Hao; Peng, Tong; Min, Junwei![]() ![]() ![]() | |
作者部门 | 瞬态光学研究室 |
2019-10 | |
发表期刊 | IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING
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ISSN | 0018-9294;1558-2531 |
卷号 | 66期号:10页码:2979-2989 |
产权排序 | 1 |
摘要 | Objective: The side-lobes of a Bessel beam (BB) create a severe out-of-focus background in scanning light-sheet fluorescence microscopy, thereby extremely limiting the axial resolution. The complementary beam subtraction (CBS) method can significantly reduce the out-of-focus background by double scanning a BB and its complementary beam. However, the blurring and noise caused by the system instability during the double scanning and subtraction operations degrade the image quality significantly. Therefore, we propose a compressed blind deconvolution and denoising (CBDD) method that solves this problem. Methods: We use a unified formulation that comprehensively takes advantage of multiple compressed sensing reconstructions and blind sparse representation. Results: The simulations and experiments were performed using the microbeads and model organisms to verify the effectiveness of the proposed method. Compared with the CBS light-sheet method, the proposed CBDD algorithm achieved the gain improvement in the axial and lateral resolution of about 1.81 and 2.22 times, respectively, while the average signal-to-noise ratio (SNR) was increased by about 3 dB. Conclusion: Accordingly, the proposed method can suppress the noise level, enhance the SNR, and recover the degraded resolution simultaneously. Significance: The obtained results demonstrate the proposed CBDD algorithm is well suited to improve the imaging performance of the CBS light-sheet fluorescence microscopy. |
关键词 | Light-sheet fluorescence microscopy blind image deconvolution denoising compressed sensing |
DOI | 10.1109/TBME.2019.2899583 |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000487192000030 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
EI入藏号 | 20200207984400 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/31879 |
专题 | 瞬态光学研究室 |
作者单位 | Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Shaanxi, Peoples R China |
推荐引用方式 GB/T 7714 | Bai, Chen,Liu, Chao,Jia, Hao,et al. Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy[J]. IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING,2019,66(10):2979-2989. |
APA | Bai, Chen.,Liu, Chao.,Jia, Hao.,Peng, Tong.,Min, Junwei.,...&Yao, Baoli.(2019).Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy.IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING,66(10),2979-2989. |
MLA | Bai, Chen,et al."Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy".IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING 66.10(2019):2979-2989. |
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Compressed Blind Dec(4394KB) | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 |
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