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Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging
Bai, Jinzhou1,2; Wang, Bo1; Bai, Yonglin1; Cao, Weiwei1; Yang, Yang1; Lei, Fanpu1; Su, Dan2
Department精密物理量测量实验室
DOI10.1117/12.2506350
Indexed ByEI
ISBN9781510623286
Language英语
ISSN0277786X;1996759X
EI Accession Number20191006603239
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Document Type会议论文
Identifierhttp://ir.opt.ac.cn/handle/181661/31299
Collection精密物理量测量实验室
Affiliation1.Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology of CAS, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China;
2.University of Chinese Academy of Sciences, Beijing; 100094, China
Recommended Citation
GB/T 7714
Bai, Jinzhou,Wang, Bo,Bai, Yonglin,et al. Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging[C].
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