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Aberration correction for improving the image quality in STED microscopy using the genetic algorithm
Wang, Luwei3; Yan, Wei3; Li, Runze4; Weng, Xiaoyu3; Zhang, Jia3; Yang, Zhigang3; Liu, Liwei3; Ye, Tong1,2; Qu, Junle3
Source PublicationNANOPHOTONICS
Contribution Rank4

With a purely optical modulation of fluorescent behaviors, stimulated emission depletion (STED) microscopy allows for far-field imaging with a diffraction-unlimited resolution in theory. The performance of STED microscopy is affected by many factors, of which aberrations induced by the optical system and biological samples can distort the wave front of the depletion beam at the focal plane to greatly deteriorate the spatial resolution and the image contrast. Therefore, aberration correction is imperative for STED imaging, especially for imaging thick specimens. Here, we present a wave front compensation approach based on the genetic algorithm (GA) to restore the distorted laser wave front for improving the quality of STED images. After performing aberration correction on two types of zebrafish samples, the signal intensity and the imaging resolution of STED images were both improved, where the thicknesses were 24 pm and 100 pm in the zebrafish retina sample and the zebrafish embryo sample, respectively. The results showed that the GA-based wave front compensation approach has the capability of correction for both system-induced and sample-induced aberrations. The elimination of aberrations can prompt STED imaging in deep tissues; therefore, STED microscopy can be expected to play an increasingly important role in super-resolution imaging related to the scientific research in biological fields.

KeywordAberration Adaptive Optics Genetic Algorithm Super-resolution Imaging
Indexed BySCI ; EI
WOS IDWOS:000451084700009
EI Accession Number20184706130541
Citation statistics
Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Corresponding AuthorYe, Tong
Affiliation1.Clemson Univ, Dept Bioengn, Clemson, SC 29634 USA
2.Clemson Univ, COMSET, Clemson, SC 29634 USA
3.Shenzhen Univ, Coll Optoelect Engn, Minist Educ & Guangdong Prov, Key Lab Optoelect Devices & Syst, Shenzhen 518060, Peoples R China
4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Shaanxi, Peoples R China
Recommended Citation
GB/T 7714
Wang, Luwei,Yan, Wei,Li, Runze,et al. Aberration correction for improving the image quality in STED microscopy using the genetic algorithm[J]. NANOPHOTONICS,2018,7(12):1971-1980.
APA Wang, Luwei.,Yan, Wei.,Li, Runze.,Weng, Xiaoyu.,Zhang, Jia.,...&Qu, Junle.(2018).Aberration correction for improving the image quality in STED microscopy using the genetic algorithm.NANOPHOTONICS,7(12),1971-1980.
MLA Wang, Luwei,et al."Aberration correction for improving the image quality in STED microscopy using the genetic algorithm".NANOPHOTONICS 7.12(2018):1971-1980.
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