OPT OpenIR  > 瞬态光学技术国家重点实验室
Aberration correction for improving the image quality in STED microscopy using the genetic algorithm
Wang, Luwei3; Yan, Wei3; Li, Runze4; Weng, Xiaoyu3; Zhang, Jia3; Yang, Zhigang3; Liu, Liwei3; Ye, Tong1,2; Qu, Junle3
作者部门瞬态光学技术国家重点实验室
2018-12
发表期刊NANOPHOTONICS
ISSN2192-8606;2192-8614
卷号7期号:12页码:1971-1980
产权排序4
摘要

With a purely optical modulation of fluorescent behaviors, stimulated emission depletion (STED) microscopy allows for far-field imaging with a diffraction-unlimited resolution in theory. The performance of STED microscopy is affected by many factors, of which aberrations induced by the optical system and biological samples can distort the wave front of the depletion beam at the focal plane to greatly deteriorate the spatial resolution and the image contrast. Therefore, aberration correction is imperative for STED imaging, especially for imaging thick specimens. Here, we present a wave front compensation approach based on the genetic algorithm (GA) to restore the distorted laser wave front for improving the quality of STED images. After performing aberration correction on two types of zebrafish samples, the signal intensity and the imaging resolution of STED images were both improved, where the thicknesses were 24 pm and 100 pm in the zebrafish retina sample and the zebrafish embryo sample, respectively. The results showed that the GA-based wave front compensation approach has the capability of correction for both system-induced and sample-induced aberrations. The elimination of aberrations can prompt STED imaging in deep tissues; therefore, STED microscopy can be expected to play an increasingly important role in super-resolution imaging related to the scientific research in biological fields.

关键词Aberration Adaptive Optics Genetic Algorithm Super-resolution Imaging
DOI10.1515/nanoph-2018-0133
收录类别SCI
语种英语
WOS记录号WOS:000451084700009
出版者WALTER DE GRUYTER GMBH
引用统计
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/30740
专题瞬态光学技术国家重点实验室
通讯作者Ye, Tong
作者单位1.Clemson Univ, Dept Bioengn, Clemson, SC 29634 USA
2.Clemson Univ, COMSET, Clemson, SC 29634 USA
3.Shenzhen Univ, Coll Optoelect Engn, Minist Educ & Guangdong Prov, Key Lab Optoelect Devices & Syst, Shenzhen 518060, Peoples R China
4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Shaanxi, Peoples R China
推荐引用方式
GB/T 7714
Wang, Luwei,Yan, Wei,Li, Runze,et al. Aberration correction for improving the image quality in STED microscopy using the genetic algorithm[J]. NANOPHOTONICS,2018,7(12):1971-1980.
APA Wang, Luwei.,Yan, Wei.,Li, Runze.,Weng, Xiaoyu.,Zhang, Jia.,...&Qu, Junle.(2018).Aberration correction for improving the image quality in STED microscopy using the genetic algorithm.NANOPHOTONICS,7(12),1971-1980.
MLA Wang, Luwei,et al."Aberration correction for improving the image quality in STED microscopy using the genetic algorithm".NANOPHOTONICS 7.12(2018):1971-1980.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Aberration correctio(1791KB)期刊论文出版稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Wang, Luwei]的文章
[Yan, Wei]的文章
[Li, Runze]的文章
百度学术
百度学术中相似的文章
[Wang, Luwei]的文章
[Yan, Wei]的文章
[Li, Runze]的文章
必应学术
必应学术中相似的文章
[Wang, Luwei]的文章
[Yan, Wei]的文章
[Li, Runze]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Aberration correction for improving the image quality in STED microscopy using the genetic algorithm.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。