| Optical thickness measurement with single-shot dual-wavelength in-line digital holography | |
| Min, Junwei1,2; Zhou, Meiling1; Yuan, Xun1; Wen, Kai1,3; Yu, Xianghua1,2; Peng, Tong1,2; Yao, Baoli1,2 | |
| 作者部门 | 瞬态光学技术国家重点实验室 |
| 2018-09-15 | |
| 发表期刊 | Optics Letters
 |
| ISSN | 01469592;15394794 |
| 卷号 | 43期号:18页码:4469-4472 |
| 产权排序 | 1 |
| 摘要 | An algorithm for quantitative reconstruction of the optical thickness distribution of objects is proposed based on single-shot dual-wavelength in-line digital holography. Two single-wavelength holograms can be extracted from a single-shot recorded dual-wavelength in-line hologram. The quantitative optical thickness distribution of the specimen can be reconstructed directly without calculations of the phase images at every single wavelength. Thus, off-axis recording and phase-shifting operation are not required, enabling a fast and high-resolution measurement. The effectiveness and accuracy of the proposed method are verified by both numerical simulations and experimental results. ? 2018 Optical Society of America |
| DOI | 10.1364/OL.43.004469 |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000444400100040 |
| 出版者 | OSA - The Optical Society |
| EI入藏号 | 20183805821921 |
| 引用统计 | |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.opt.ac.cn/handle/181661/30633 |
| 专题 | 瞬态光学研究室 |
| 通讯作者 | Yao, Baoli |
| 作者单位 | 1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China; 2.Xi’an Jiaotong University, No. 28 Xianning West Road, Xi’an; 710049, China; 3.College of Physics and Information Technology, Shaanxi Normal University, Xi’an; 710071, China |
| 推荐引用方式 GB/T 7714 | Min, Junwei,Zhou, Meiling,Yuan, Xun,et al. Optical thickness measurement with single-shot dual-wavelength in-line digital holography[J]. Optics Letters,2018,43(18):4469-4472. |
| APA | Min, Junwei.,Zhou, Meiling.,Yuan, Xun.,Wen, Kai.,Yu, Xianghua.,...&Yao, Baoli.(2018).Optical thickness measurement with single-shot dual-wavelength in-line digital holography.Optics Letters,43(18),4469-4472. |
| MLA | Min, Junwei,et al."Optical thickness measurement with single-shot dual-wavelength in-line digital holography".Optics Letters 43.18(2018):4469-4472. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| Optical thickness me（2037KB） | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 | |
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