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Optical thickness measurement with single-shot dual-wavelength in-line digital holography
Min, Junwei1,2; Zhou, Meiling1; Yuan, Xun1; Wen, Kai1,3; Yu, Xianghua1,2; Peng, Tong1,2; Yao, Baoli1,2
Department瞬态光学技术国家重点实验室
2018-09-15
Source PublicationOptics Letters
ISSN01469592;15394794
Volume43Issue:18Pages:4469-4472
Contribution Rank1
AbstractAn algorithm for quantitative reconstruction of the optical thickness distribution of objects is proposed based on single-shot dual-wavelength in-line digital holography. Two single-wavelength holograms can be extracted from a single-shot recorded dual-wavelength in-line hologram. The quantitative optical thickness distribution of the specimen can be reconstructed directly without calculations of the phase images at every single wavelength. Thus, off-axis recording and phase-shifting operation are not required, enabling a fast and high-resolution measurement. The effectiveness and accuracy of the proposed method are verified by both numerical simulations and experimental results. ? 2018 Optical Society of America
DOI10.1364/OL.43.004469
Indexed BySCI ; EI
Language英语
WOS IDWOS:000444400100040
PublisherOSA - The Optical Society
EI Accession Number20183805821921
Citation statistics
Document Type期刊论文
Identifierhttp://ir.opt.ac.cn/handle/181661/30633
Collection瞬态光学技术国家重点实验室
Corresponding AuthorYao, Baoli
Affiliation1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China;
2.Xi’an Jiaotong University, No. 28 Xianning West Road, Xi’an; 710049, China;
3.College of Physics and Information Technology, Shaanxi Normal University, Xi’an; 710071, China
Recommended Citation
GB/T 7714
Min, Junwei,Zhou, Meiling,Yuan, Xun,et al. Optical thickness measurement with single-shot dual-wavelength in-line digital holography[J]. Optics Letters,2018,43(18):4469-4472.
APA Min, Junwei.,Zhou, Meiling.,Yuan, Xun.,Wen, Kai.,Yu, Xianghua.,...&Yao, Baoli.(2018).Optical thickness measurement with single-shot dual-wavelength in-line digital holography.Optics Letters,43(18),4469-4472.
MLA Min, Junwei,et al."Optical thickness measurement with single-shot dual-wavelength in-line digital holography".Optics Letters 43.18(2018):4469-4472.
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