Key technology research on monocular vision pose measurement under complex background | |
Zhou, Zuofeng1![]() ![]() ![]() | |
2018-06-08 | |
会议名称 | 10th International Conference on Advanced Computational Intelligence, ICACI 2018 |
会议录名称 | Proceedings - 2018 10th International Conference on Advanced Computational Intelligence, ICACI 2018 |
页码 | 134-139 |
会议日期 | 2018-03-29 |
会议地点 | Xiamen, Fujian, China |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
产权排序 | 1 |
摘要 | In the space exploration, the high precision measurement of the position and orientation of the space target is still a challenging problem. In this paper, we present the key technology research on monocular vision pose measurement under complex background. First, the space target features including the center location of the light spot and the circle detection are extracted. Second, we measure the circle pose and using the points outside the circle to remove the false solution. Finally, the monocular ground testing system is established to test the performance of the proposed algorithm. The experiment results show that when the distance between the camera and the target is 1200mm, the translation error is 1.5mm and the rotate error is 0.8 degrees, respectively. © 2018 IEEE. |
作者部门 | 动态光学成像研究室 |
DOI | 10.1109/ICACI.2018.8377594 |
收录类别 | EI |
ISBN号 | 9781538643624 |
语种 | 英语 |
EI入藏号 | 20182905552034 |
EI主题词 | Artificial Intelligence ; Measurement ; Space Research ; Vision |
EI分类号 | 656.2 Space Research ; 723.4 Artificial Intelligence ; 901.3 Engineering Research |
引用统计 | |
文献类型 | 会议论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/30517 |
专题 | 飞行器光学成像与测量技术研究室 |
作者单位 | 1.Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an, China; 2.Xidian University, Xi'an, China; 3.Xi'An Institute of Optics and Precision Mechanics of CAS, University of Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Zhou, Zuofeng,Cao, Jianzhong,Yang, Hongtao,et al. Key technology research on monocular vision pose measurement under complex background[C]:Institute of Electrical and Electronics Engineers Inc.,2018:134-139. |
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