Subwavelength resolution Fourier ptychography with hemispherical digital condensers | |
Pan, An1,2; Zhang, Yan1,2![]() ![]() ![]() | |
2018 | |
会议名称 | Quantitative Phase Imaging IV 2018 |
会议录名称 | Quantitative Phase Imaging IV |
卷号 | 10503 |
会议日期 | 2018-01-28 |
会议地点 | San Francisco, CA, United states |
出版者 | SPIE |
产权排序 | 1 |
摘要 | Fourier ptychography (FP) is a promising computational imaging technique that overcomes the physical space-bandwidth product (SBP) limit of a conventional microscope by applying angular diversity illuminations. However, to date, the effective imaging numerical aperture (NA) achievable with a commercial LED board is still limited to the range of 0.3-0.7 with a 4×/0.1NA objective due to the constraint of planar geometry with weak illumination brightness and attenuated signal-to-noise ratio (SNR). Thus the highest achievable half-pitch resolution is usually constrained between 500-1000 nm, which cannot fulfill some needs of high-resolution biomedical imaging applications. Although it is possible to improve the resolution by using a higher magnification objective with larger NA instead of enlarging the illumination NA, the SBP is suppressed to some extent, making the FP technique less appealing, since the reduction of field-of-view (FOV) is much larger than the improvement of resolution in this FP platform. Herein, in this paper, we initially present a subwavelength resolution Fourier ptychography (SRFP) platform with a hemispherical digital condenser to provide high-angle programmable plane-wave illuminations of 0.95NA, attaining a 4×/0.1NA objective with the final effective imaging performance of 1.05NA at a half-pitch resolution of 244 nm with a wavelength of 465 nm across a wide FOV of 14.60 mm2, corresponding to an SBP of 245 megapixels. Our work provides an essential step of FP towards high-NA imaging applications without scarfing the FOV, making it more practical and appealing. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only. |
关键词 | Computational Imaging Fourier Ptychography Phase Retrieval Quantitative Phase Imaging |
作者部门 | 瞬态光学技术国家重点实验室 |
DOI | 10.1117/12.2289906 |
收录类别 | EI ; CPCI |
ISBN号 | 9781510614918 |
语种 | 英语 |
ISSN号 | 0277786X;1996756X |
WOS记录号 | WOS:000452819800030 |
EI入藏号 | 20181905144651 |
引用统计 | |
文献类型 | 会议论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/30096 |
专题 | 瞬态光学研究室 |
作者单位 | 1.Chinese Academy of Sciences, Xi'An Institute of Optics and Precision Mechanics, State Key Laboratory of Transient Optics and Photonics, No.17 Xinxi Road, Xi'an, Shaanxi; 710119, China 2.University of Chinese Academy of Sciences, No.19 Yuquan Road, Beijing; 100049, China 3.Xidian University, No.2 South Taibai Road, Xi'an, Shaanxi; 710071, China |
推荐引用方式 GB/T 7714 | Pan, An,Zhang, Yan,Li, Maosen,et al. Subwavelength resolution Fourier ptychography with hemispherical digital condensers[C]:SPIE,2018. |
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