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Subwavelength resolution Fourier ptychography with hemispherical digital condensers
Pan, An1,2; Zhang, Yan1,2; Li, Maosen3; Zhou, Meiling1,2; Lei, Ming1; Yao, Baoli1
2018
会议名称Quantitative Phase Imaging IV 2018
会议录名称Quantitative Phase Imaging IV
卷号10503
会议日期2018-01-28
会议地点San Francisco, CA, United states
出版者SPIE
产权排序1
摘要

Fourier ptychography (FP) is a promising computational imaging technique that overcomes the physical space-bandwidth product (SBP) limit of a conventional microscope by applying angular diversity illuminations. However, to date, the effective imaging numerical aperture (NA) achievable with a commercial LED board is still limited to the range of 0.3-0.7 with a 4×/0.1NA objective due to the constraint of planar geometry with weak illumination brightness and attenuated signal-to-noise ratio (SNR). Thus the highest achievable half-pitch resolution is usually constrained between 500-1000 nm, which cannot fulfill some needs of high-resolution biomedical imaging applications. Although it is possible to improve the resolution by using a higher magnification objective with larger NA instead of enlarging the illumination NA, the SBP is suppressed to some extent, making the FP technique less appealing, since the reduction of field-of-view (FOV) is much larger than the improvement of resolution in this FP platform. Herein, in this paper, we initially present a subwavelength resolution Fourier ptychography (SRFP) platform with a hemispherical digital condenser to provide high-angle programmable plane-wave illuminations of 0.95NA, attaining a 4×/0.1NA objective with the final effective imaging performance of 1.05NA at a half-pitch resolution of 244 nm with a wavelength of 465 nm across a wide FOV of 14.60 mm2, corresponding to an SBP of 245 megapixels. Our work provides an essential step of FP towards high-NA imaging applications without scarfing the FOV, making it more practical and appealing. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

关键词Computational Imaging Fourier Ptychography Phase Retrieval Quantitative Phase Imaging
作者部门瞬态光学技术国家重点实验室
DOI10.1117/12.2289906
收录类别EI ; CPCI
ISBN号9781510614918
语种英语
ISSN号0277786X;1996756X
WOS记录号WOS:000452819800030
EI入藏号20181905144651
引用统计
被引频次:16[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/30096
专题瞬态光学研究室
作者单位1.Chinese Academy of Sciences, Xi'An Institute of Optics and Precision Mechanics, State Key Laboratory of Transient Optics and Photonics, No.17 Xinxi Road, Xi'an, Shaanxi; 710119, China
2.University of Chinese Academy of Sciences, No.19 Yuquan Road, Beijing; 100049, China
3.Xidian University, No.2 South Taibai Road, Xi'an, Shaanxi; 710071, China
推荐引用方式
GB/T 7714
Pan, An,Zhang, Yan,Li, Maosen,et al. Subwavelength resolution Fourier ptychography with hemispherical digital condensers[C]:SPIE,2018.
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