Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters

doi:10.1088/0960-1317/26/4/045011

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	Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters
	Shen, Zhihua 1; Wang, Xiao 1; Wu, Shengli 1; Tian, JinShou2
作者部门	精密物理量测量实验室
	2016-04-01
发表期刊	JOURNAL OF MICROMECHANICS AND MICROENGINEERING
ISSN	0960-1317
卷号	26 期号:4
产权排序	2
摘要	A simulation model was built to numerically investigate the electron emission property of a new surface-conduction electron emitter (SCE) with a raised emitter structure. The model calculated the electric field distribution, the electron emission characteristics, and the electron trajectories, which were useful for analyzing and understanding the microscopic mechanism of the electron emissions of the new SCE structure. It was found that the new structure increased the probability of electrons being collected by the anode which led to an increase of the anode current despite of the decrease of field emission current. This study benefits the advanced design of emitter structures in nanoscale technology for new types of electron sources.
文章类型	Article
关键词	Finite Integration Technique (Fit) Nanometer-scale Fissure Surface-conduction Electron Emitter
WOS标题词	Science & Technology ; Technology
DOI	10.1088/0960-1317/26/4/045011
收录类别	SCI ; EI
关键词[WOS]	FIELD-EMISSION CHARACTERISTICS ; X-RAY SOURCE ; WORK FUNCTION ; EFFICIENCY
语种	英语
WOS研究方向	Engineering ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Materials Science ; Mechanics
项目资助者	National Natural Science Foundation of China(51271140 ; 61275023)
WOS类目	Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Materials Science, Multidisciplinary ; Mechanics
WOS记录号	WOS:000375230900011
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.opt.ac.cn/handle/181661/28123
专题	条纹相机工程中心
作者单位	1.Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Peoples R China 2.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
推荐引用方式 GB/T 7714	Shen, Zhihua,Wang, Xiao,Wu, Shengli,et al. Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters[J]. JOURNAL OF MICROMECHANICS AND MICROENGINEERING,2016,26(4).
APA	Shen, Zhihua,Wang, Xiao,Wu, Shengli,&Tian, JinShou.(2016).Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters.JOURNAL OF MICROMECHANICS AND MICROENGINEERING,26(4).
MLA	Shen, Zhihua,et al."Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters".JOURNAL OF MICROMECHANICS AND MICROENGINEERING 26.4(2016).

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