| Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions | |
Yan, Haidong1,2,3; Mei, Yunhui1,2,3; Li, Xin2,3; Zhang, Pu4 ; Lu, Guo-Quan5; Mei, YH
| |
| 作者部门 | 瞬态光学技术国家重点实验室 |
| 2015-12-01 | |
| 发表期刊 | MICROELECTRONICS RELIABILITY
 |
| ISSN | 0026-2714 |
| 卷号 | 55期号:12页码:2532-2541 |
| 产权排序 | 3 |
| 摘要 | This paper is mainly reported to a pulse reliability investigation of high power single emitter laser modules with nanosilver paste. Comparative experiments in continuous pulse conditions for the laser modules packaged with nanosilver paste, indium and AuSn solders were conducted. The results indicate that the laser modules attached by nanosilver paste have a longer-term lifetime than those with indium and AuSn solders in continuous pulse conditions. Transient thermal behavior and coupled thermo-mechanical behavior in continuous pulse conditions are simulated by finite element method (FEM). A semi-empirical model based on Arrhenius relationship is established to provide relative reliability assessments for laser modules by combining with the simulating results. (C) 2015 Elsevier Ltd. All rights reserved. |
| 文章类型 | Article |
| 关键词 | Nanosilver Paste Laser Module Die-attach Interface Pulse Mode Reliability |
| 学科领域 | Engineering, Electrical & Electronic |
| WOS标题词 | Science & Technology ; Technology ; Physical Sciences |
| DOI | 10.1016/j.microrel.2015.07.037 |
| 收录类别 | SCI ; EI |
| 关键词[WOS] | DIODE BARS ; SEMICONDUCTOR-LASERS ; THERMAL-PROPERTIES ; INTERFACE MATERIAL ; INDIUM SOLDER ; AU/SN SOLDER ; RELIABILITY ; TEMPERATURE ; PACKAGES ; FAILURE |
| 语种 | 英语 |
| WOS研究方向 | Engineering ; Science & Technology - Other Topics ; Physics |
| 项目资助者 | National Natural Science Foundation of China(61334010) ; Tianjin Municipal Natural Science Foundation(13JCQNJC06600 ; 13JCZDJC33600 ; 13JCQNJC02400) |
| WOS类目 | Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied |
| WOS记录号 | WOS:000367773000010 |
| 引用统计 | |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.opt.ac.cn/handle/181661/27291 |
| 专题 | 瞬态光学研究室 |
| 通讯作者 | Mei, YH |
| 作者单位 | 1.Tianjin Univ, Minist Educ, Key Lab Adv Ceram & Machining Technol, Tianjin 300072, Peoples R China 2.Tianjin Univ, Tianjin Key Lab Adv Joining Technol, Tianjin 300072, Peoples R China 3.Tianjin Univ, Sch Mat Sci & Engn, Tianjin 300072, Peoples R China 4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 5.Virginia Tech, Dept Mat Sci & Engn, Blacksburg, VA 24061 USA |
| 推荐引用方式 GB/T 7714 | Yan, Haidong,Mei, Yunhui,Li, Xin,et al. Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions[J]. MICROELECTRONICS RELIABILITY,2015,55(12):2532-2541. |
| APA | Yan, Haidong,Mei, Yunhui,Li, Xin,Zhang, Pu,Lu, Guo-Quan,&Mei, YH.(2015).Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions.MICROELECTRONICS RELIABILITY,55(12),2532-2541. |
| MLA | Yan, Haidong,et al."Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions".MICROELECTRONICS RELIABILITY 55.12(2015):2532-2541. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| Degradation of high （2559KB） | 期刊论文 | 作者接受稿 | 限制开放 | CC BY-NC-SA | 请求全文 | |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论