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Confidence guided enhancing brain tumor segmentation in multi-parametric MRI
Reddy, Kishore K.; Solmaz, Berkan; Yan, Pingkun; Avgeropoulos, Nicholas G.; Rippe, David J.; Shah, Mubarak
2012
会议名称2012 9th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2012
会议录名称2012 9th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2012 - Proceedings
页码366-369
会议日期May 2, 2012 - May 5, 2012
会议地点Barcelona, Spain
出版地United States
会议主办者The Institute of Electrical and Electronic Engineers; Engineering in Medicine and Biology Society; Signal Processing Society
出版者IEEE Computer Society, 445 Hoes Lane - P.O.Box 1331, Piscataway, NJ 08855-1331, United States
产权排序2
摘要Enhancing brain tumor segmentation for accurate tumor volume measurement is a challenging task due to the large variation of tumor appearance and shape, which makes it difficult to incorporate prior knowledge commonly used by other medical image segmentation tasks. In this paper, a novel idea of confidence surface is proposed to guide the segmentation of enhancing brain tumor using information across multi-parametric magnetic resonance imaging (MRI). Texture information along with the typical intensity information from pre-contrast T1 weighted (T1 pre), post-contrast T1 weighted (T1 post), T2 weighted (T2), and fluid attenuated inversion recovery (FLAIR) MRI images are used to train a discriminative classifier at pixel level. The classifier is used to generate a confidence surface, which gives a likelihood of each pixel being a tumor or non-tumor. The obtained confidence surface is then incorporated into two classical methods for segmentation guidance. The proposed approach was evaluated on 19 groups of MRI images with tumor and promising results have been demonstrated.
作者部门光学影像分析与学习中心
收录类别CPCI(ISTP) ; EI
ISBN号9781457718588
语种英语
ISSN号19457928
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/20540
专题光谱成像技术研究室
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Reddy, Kishore K.,Solmaz, Berkan,Yan, Pingkun,et al. Confidence guided enhancing brain tumor segmentation in multi-parametric MRI[C]. United States:IEEE Computer Society, 445 Hoes Lane - P.O.Box 1331, Piscataway, NJ 08855-1331, United States,2012:366-369.
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