Micro/Nano displacement measurement using sub-pixel DSCM

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	Micro/Nano displacement measurement using sub-pixel DSCM
	LiXin-Zhong; TaiYu-Ping; NieZhao-Gang; ZhangLi-Ping; WangYa-Jun; Li Xinzhong
	2011
会议名称	International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging
会议录名称	Proceedings of SPIE - The International Society for Optical Engineering
页码	819213
会议日期	May 24, 2011 - May 26, 2011
会议地点	Beijing, China
出版地	P.O. Box 10, Bellingham, WA 98227-0010, United States
出版者	SPIE
会议主办者	Chinese Society of Astronautics (CAS)
产权排序	3
摘要	A selection method of subset size in sub-pixel displacement registration is proposed. The algorithm principle of interpolation, fitting of distribution of the correlation coefficients and gradient-based methods are introduced. Using computer-simulated speckle images, their precision and efficiency depending on the subset size are studied. The optimal method and subset size are presented in various measurement ranges, which offer measuring bases for sub-pixel in DSCM.
关键词	Micro/nano Displacement Digital Speckle Correlation Method Sub-pixel Subset Size
作者部门	网络信息中心
收录类别	EI
语种	英语
ISSN号	0277-786X
文献类型	会议论文
条目标识符	http://ir.opt.ac.cn/handle/181661/20220
专题	信息中心
通讯作者	Li Xinzhong
推荐引用方式 GB/T 7714	LiXin-Zhong,TaiYu-Ping,NieZhao-Gang,et al. Micro/Nano displacement measurement using sub-pixel DSCM[C]. P.O. Box 10, Bellingham, WA 98227-0010, United States:SPIE,2011:819213.

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文件名称/大小	文献类型	版本类型	开放类型	使用许可
MicroNano displaceme（517KB）			限制开放	--	请求全文