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Filter bypass method and system for chiller loop to control coolant purity levels. 专利
专利类型: 发明申请, 专利号: EP1491964A2, 申请日期: 2004-12-29, 公开日期: 2004-12-29
发明人:  MORRELL, JOHN
Adobe PDF(159Kb)  |  收藏  |  浏览/下载：42/0  |  提交时间：2019/12/30
Filter bypass method and system for chiller loop to control coolant purity levels. 专利
专利类型: 发明申请, 专利号: EP1491964A2, 申请日期: 2004-12-29, 公开日期: 2004-12-29
发明人:  MORRELL, JOHN
Adobe PDF(159Kb)  |  收藏  |  浏览/下载：101/0  |  提交时间：2019/12/30
Packaging platform, optical module using the platform, and methods for producing the platform and the module 专利
专利类型: 发明申请, 专利号: EP0864893A2, 申请日期: 1998-09-16, 公开日期: 1998-09-16
发明人:  AMANO, MICHIYUKI, C/O NIPPON TELEG. AND TEL. CORP.;  TONO, SHUNICHI, C/O NIPPON TELEG. AND TEL. CORP.;  SATO, HIROTSUGU, C/O NIPPON TELEG. AND TEL. CORP.;  TAMURA, YASUAKI, C/O NIPPON TELEG. AND TEL. CORP.;  SHUTO, YOSHITO, C/O NIPPON TELEG. AND TEL. CORP.;  YOKOYAMA, KENJI, C/O NIPPON TELEG. AND TEL. CORP.;  KOZAWAGUCHI, HARUKI, C/O NIPPON TELEG.& TEL. CORP.;  HIKITA, MAKOTO, C/O NIPPON TELEGRAPH & TEL. CORP.;  YOSHIMURA, RYOKO, C/O NIPPON TELEG. & TEL. CORP.;  TOMARU, SATORU, C/O NIPPON TELEG. & TEL. CORP.;  IMAMURA, SABURO, C/O NIPPON TELEG. & TEL. CORP.;  HASHIMOTO, TOSHIKAZU, C/O NIPPON T. & T. CORP.;  YAMADA, YASUFUMI, C/O NIPPON T. & T. CORP.;  KATO, KUNIHARU, C/O NIPPON T. & T. CORP.;  YANAGISAWA, MASAHIRO, C/O NIPPON T. & T. CORP.;  SUGITA, AKIO, C/O NIPPON TELEG. & TEL. CORP.
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Packaging platform, optical module using the platform, and methods for producing the platform and the module 专利
专利类型: 发明申请, 专利号: EP0864893A2, 申请日期: 1998-09-16, 公开日期: 1998-09-16
发明人:  AMANO, MICHIYUKI, C/O NIPPON TELEG. AND TEL. CORP.;  TONO, SHUNICHI, C/O NIPPON TELEG. AND TEL. CORP.;  SATO, HIROTSUGU, C/O NIPPON TELEG. AND TEL. CORP.;  TAMURA, YASUAKI, C/O NIPPON TELEG. AND TEL. CORP.;  SHUTO, YOSHITO, C/O NIPPON TELEG. AND TEL. CORP.;  YOKOYAMA, KENJI, C/O NIPPON TELEG. AND TEL. CORP.;  KOZAWAGUCHI, HARUKI, C/O NIPPON TELEG.& TEL. CORP.;  HIKITA, MAKOTO, C/O NIPPON TELEGRAPH & TEL. CORP.;  YOSHIMURA, RYOKO, C/O NIPPON TELEG. & TEL. CORP.;  TOMARU, SATORU, C/O NIPPON TELEG. & TEL. CORP.;  IMAMURA, SABURO, C/O NIPPON TELEG. & TEL. CORP.;  HASHIMOTO, TOSHIKAZU, C/O NIPPON T. & T. CORP.;  YAMADA, YASUFUMI, C/O NIPPON T. & T. CORP.;  KATO, KUNIHARU, C/O NIPPON T. & T. CORP.;  YANAGISAWA, MASAHIRO, C/O NIPPON T. & T. CORP.;  SUGITA, AKIO, C/O NIPPON TELEG. & TEL. CORP.
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Methods and apparatus for detecting impurities in semiconductors 专利
专利类型: 发明申请, 专利号: EP0422780A2, 申请日期: 1991-04-17, 公开日期: 1991-04-17
发明人:  CARVER, GARY ERNEST;  MICHALSKI, JOHN DENNIS;  KOOS, GREGORY LEE
Adobe PDF(630Kb)  |  收藏  |  浏览/下载：51/0  |  提交时间：2019/12/31