| Analysis and Design of Fault Prediction and Health Assessment System for the optoelectronic Equipment | |
| Zhang, Chuming1; Wei, Guojun1; Wang, Xuan2; Cao, Yu2; Xie, Meilin2 | |
| 2022 | |
| 会议名称 | 5th IEEE Advanced Information Management, Communicates, Electronic and Automation Control Conference, IMCEC 2022 |
| 会议录名称 | IMCEC 2022 - IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference |
| 页码 | 891-895 |
| 会议日期 | 2022-12-16 |
| 会议地点 | Chongqing, China |
| 出版者 | Institute of Electrical and Electronics Engineers Inc. |
| 产权排序 | 2 |
| 摘要 | In recent years, due to the rise of emerging technologies such as integrated circuits, artificial intelligence and big data, Optical measurement equipment performance is also constantly improving, more and more new technology, new processes, new materials continue to appear. Therefore, the maintenance of the optoelectronic equipment is also much more difficult. Based on these problems, this paper investigates the application of fault prediction and health management in optoelectronic devices. The main analysis and design of the system failure prediction and health assessment, and in response to the needs of optoelectronic devices for the life analysis, health status determination, fault prediction alarms, etc, designed a failure prediction and health assessment system for optoelectronic devices. © 2022 IEEE. |
| 关键词 | optoelectronic equipment Fault prediction Health assessment statistical analysis |
| 作者部门 | 光电跟踪与测量技术研究室 |
| DOI | 10.1109/IMCEC55388.2022.10019826 |
| 收录类别 | EI |
| ISBN号 | 9781665479677 |
| 语种 | 英语 |
| EI入藏号 | 20230713575048 |
| 引用统计 | |
| 文献类型 | 会议论文 |
| 条目标识符 | http://ir.opt.ac.cn/handle/181661/96357 |
| 专题 | 光电跟踪与测量技术研究室 |
| 作者单位 | 1.Space Engineering University, China; 2.Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an; 710119, China |
| 推荐引用方式 GB/T 7714 | Zhang, Chuming,Wei, Guojun,Wang, Xuan,et al. Analysis and Design of Fault Prediction and Health Assessment System for the optoelectronic Equipment[C]:Institute of Electrical and Electronics Engineers Inc.,2022:891-895. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| Analysis and Design （4902KB） | 会议论文 | 限制开放 | CC BY-NC-SA | 请求全文 | ||
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