Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition | |
Pan, An1,2; Wang, Aiye1,2,4; Zheng, Junfu3; Gao, Yuting1,2,4; Ma, Caiwen1,2,4![]() ![]() | |
作者部门 | 瞬态光学研究室 |
2023-03 | |
发表期刊 | OPTICS AND LASERS IN ENGINEERING
![]() |
ISSN | 0143-8166;1873-0302 |
卷号 | 162 |
产权排序 | 1 |
摘要 | Fourier ptychographic microscopy (FPM) is a promising computational imaging technique with high resolution, wide field-of-view (FOV) and quantitative phase recovery. So far, a series of system errors that may corrupt the image quality of FPM has been reported. However, an imperceptible artifact caused by edge effect caught our attention and may also degrade the precision of phase imaging in FPM with a cross-shape artifact in the Fourier space. We found that the precision of reconstructed phase at the same subregion depends on the different sizes of block processing as a result of different edge conditions, which limits the quantitative phase measurements via FPM. And this artifact is caused by the aperiodic image extension of fast Fourier transform (FFT). Herein, to remove the edge effect and improve the accuracy, two classes of opposite algorithms termed discrete cosine transform (DCT) and periodic plus smooth image decomposition (PPSID) were reported respectively and discussed systematically. Although both approaches can remove the artifacts in FPM and may be extended to other Fourier analysis techniques, PPSID-FPM has a comparable efficiency to conventional FPM algorithm. The PPSID-FPM algorithm improves the standard deviation of phase accuracy as a factor of 4 from 0.08 radians to 0.02 radians. Finally, we summarized and discussed all the reported system errors of FPM within a generalized model. |
关键词 | Fourier ptychographic microscopy Computational optical imaging Edge effect Fast Fourier transform |
DOI | 10.1016/j.optlaseng.2022.107408 |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000899357200005 |
出版者 | ELSEVIER SCI LTD |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/96285 |
专题 | 瞬态光学研究室 |
通讯作者 | Pan, An; Yao, Baoli |
作者单位 | 1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Univ Rochester, Inst Opt, Rochester, NY 14627 USA 4.Chinese Acad Sci, Key Lab Space Precis Measurement Technol, Xian 710119, Peoples R China |
推荐引用方式 GB/T 7714 | Pan, An,Wang, Aiye,Zheng, Junfu,et al. Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition[J]. OPTICS AND LASERS IN ENGINEERING,2023,162. |
APA | Pan, An,Wang, Aiye,Zheng, Junfu,Gao, Yuting,Ma, Caiwen,&Yao, Baoli.(2023).Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition.OPTICS AND LASERS IN ENGINEERING,162. |
MLA | Pan, An,et al."Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition".OPTICS AND LASERS IN ENGINEERING 162(2023). |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Edge effect removal (3304KB) | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论