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Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition
Pan, An1,2; Wang, Aiye1,2,4; Zheng, Junfu3; Gao, Yuting1,2,4; Ma, Caiwen1,2,4; Yao, Baoli1,2
作者部门瞬态光学研究室
2023-03
发表期刊OPTICS AND LASERS IN ENGINEERING
ISSN0143-8166;1873-0302
卷号162
产权排序1
摘要

Fourier ptychographic microscopy (FPM) is a promising computational imaging technique with high resolution, wide field-of-view (FOV) and quantitative phase recovery. So far, a series of system errors that may corrupt the image quality of FPM has been reported. However, an imperceptible artifact caused by edge effect caught our attention and may also degrade the precision of phase imaging in FPM with a cross-shape artifact in the Fourier space. We found that the precision of reconstructed phase at the same subregion depends on the different sizes of block processing as a result of different edge conditions, which limits the quantitative phase measurements via FPM. And this artifact is caused by the aperiodic image extension of fast Fourier transform (FFT). Herein, to remove the edge effect and improve the accuracy, two classes of opposite algorithms termed discrete cosine transform (DCT) and periodic plus smooth image decomposition (PPSID) were reported respectively and discussed systematically. Although both approaches can remove the artifacts in FPM and may be extended to other Fourier analysis techniques, PPSID-FPM has a comparable efficiency to conventional FPM algorithm. The PPSID-FPM algorithm improves the standard deviation of phase accuracy as a factor of 4 from 0.08 radians to 0.02 radians. Finally, we summarized and discussed all the reported system errors of FPM within a generalized model.

关键词Fourier ptychographic microscopy Computational optical imaging Edge effect Fast Fourier transform
DOI10.1016/j.optlaseng.2022.107408
收录类别SCI
语种英语
WOS记录号WOS:000899357200005
出版者ELSEVIER SCI LTD
引用统计
被引频次:4[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/96285
专题瞬态光学研究室
通讯作者Pan, An; Yao, Baoli
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
3.Univ Rochester, Inst Opt, Rochester, NY 14627 USA
4.Chinese Acad Sci, Key Lab Space Precis Measurement Technol, Xian 710119, Peoples R China
推荐引用方式
GB/T 7714
Pan, An,Wang, Aiye,Zheng, Junfu,et al. Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition[J]. OPTICS AND LASERS IN ENGINEERING,2023,162.
APA Pan, An,Wang, Aiye,Zheng, Junfu,Gao, Yuting,Ma, Caiwen,&Yao, Baoli.(2023).Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition.OPTICS AND LASERS IN ENGINEERING,162.
MLA Pan, An,et al."Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition".OPTICS AND LASERS IN ENGINEERING 162(2023).
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