瞬态光学研究室知识库

A method to quantitatively measure the refractive index (RI) and the topography of transparent samples is proposed. Three quantitative phase images at different wavelengths are firstly obtained by using a quadriwave lateral shearing interferometry (QLSI) technique, and then the RIs at the three wavelengths and the physical thickness distribution of the sample are independently calculated with the help of Cauchy's dispersion formula. Neither the highly dispersive medium nor the manual operation of changing the surrounding medium is required. From the measured RIs, the composition of the sample can be identified besides the topography of the sample. Both simulation and experimental results verified the effectiveness and feasibility of the proposed method.