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Improved Active Disturbance Rejection Control of optoelectronic stabilized platform Based on Reduced-order Extended State Observer
Gao, Peng1,2,3; Su, Xiuqin1; Wang, Weifeng1; Zhang, Wenbo1,2,3
2021-10-15
会议名称5th IEEE Information Technology, Networking, Electronic and Automation Control Conference, ITNEC 2021
会议录名称IEEE Information Technology, Networking, Electronic and Automation Control Conference, ITNEC 2021
页码889-894
会议日期2021-10-15
会议地点Xi'an, China
出版者Institute of Electrical and Electronics Engineers Inc.
产权排序1
摘要

In order to improve the anti-disturbance ability and dynamic response characteristics of the optoelectronic stabilized platform, an improved linear active disturbance rejection control (ADRC) algorithm is proposed. The algorithm adopts reduced-order extended state observer (RESO) to realize fast tracking and estimating disturbances, which improves the restraining rapidity of disturbances. The Variable Speed Integral Proportional Integral (VSIPI) algorithm is introduced to solve the contradiction between transition speed and response overshoot, so as to obtain faster response speed and lower overshoot. The simulation results show that the algorithm has stronger anti-interference ability and robustness than the traditional PI. © 2021 IEEE.

关键词active disturbance rejection control optoelectronic stabilized platform extended state observe Variable Speed Integral optical axis
作者部门光电跟踪与测量技术研究室
DOI10.1109/ITNEC52019.2021.9587065
收录类别EI
ISBN号9781665415989
语种英语
EI入藏号20214711192834
引用统计
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/95547
专题光电跟踪与测量技术研究室
通讯作者Gao, Peng
作者单位1.Xi'An Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China;
2.School of Electronic and Information Engineering, Xi'An Jiaotong University, Xi'an; 710049, China;
3.University of Chinese Academy of Sciences, Beijing; 100049, China
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Gao, Peng,Su, Xiuqin,Wang, Weifeng,et al. Improved Active Disturbance Rejection Control of optoelectronic stabilized platform Based on Reduced-order Extended State Observer[C]:Institute of Electrical and Electronics Engineers Inc.,2021:889-894.
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