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Time-of-Flight Depth-Resolved Imaging with Heralded Photon Source Illumination
Ren, Ximing1,3; Frick, Stefan2,4; McMillan, Alex2; Chen, Songmao1,5; Halimi, Abderrahim1; Connolly, Peter W. R.1; Joshi, Siddarth K.2; McLaughlin, Stephen1; Rarity, John G.2; Matthews, Jonathan C. F.2; Buller, Gerald S.1
2020-05
会议名称2020 Conference on Lasers and Electro-Optics, CLEO 2020
会议录名称2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
卷号2020-May
会议日期2020-05-10
会议地点San Jose, CA, United states
出版者Institute of Electrical and Electronics Engineers Inc., United States
产权排序5
摘要

We demonstrate 3D time-of-flight imaging from a scattering target illuminated with a heralded single photon source. Our image reconstruction algorithm achieves millimeter depth resolution with only 0.3 average detected photons per image pixel. © 2020 OSA.

作者部门光电跟踪与测量技术研究室
收录类别EI ; CPCI
ISBN号9781943580767
语种英语
ISSN号10928081
WOS记录号WOS:000612090002145
EI入藏号20204009262054
引用统计
被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/93725
专题光电跟踪与测量技术研究室
作者单位1.School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh; EH14 4AS, United Kingdom;
2.Quantum Engineering Technology Labs, H. H. Wills Physics Laboratory and Department of Electrical and Electronic Engineering, University of Bristol, Bristol; BS8 1FD, United Kingdom;
3.Micron School of Materials Science and Engineering, Boise State University, Boise, United States;
4.Department of Experimental Physics, University of Innsbruck, Innsbruck, Austria;
5.Xi'An Institute of Optics and Precision Mechanics, Chinese Academy of Science (CAS), Xi'an, China
推荐引用方式
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Ren, Ximing,Frick, Stefan,McMillan, Alex,et al. Time-of-Flight Depth-Resolved Imaging with Heralded Photon Source Illumination[C]:Institute of Electrical and Electronics Engineers Inc., United States,2020.
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