Xi'an Institute of Optics and Precision Mechanics,CAS
| Study on the tail in TDOE of the coated MCP-PMT and its suppression | |
| 其他题名 | Chen, Lin(1); Wang, Xingchao(2,3); Tian, Jinshou(4); Fan, Lixing(1); Tian, Liping(1); Shen, Lingbin(1) |
Chen, Lin1; Wang, Xingchao2,3 ; Tian, Jinshou4; Fan, Lixing1; Tian, Liping1; Shen, Lingbin1
| |
| 2019 | |
| 会议名称 | Optoelectronic Devices and Integration VIII 2019 |
| 会议录名称 | Optoelectronic Devices and Integration VIII |
| 卷号 | 11184 |
| 会议日期 | 2019-10-22 |
| 会议地点 | Hangzhou, China |
| 出版者 | SPIE |
| 产权排序 | 4 |
| 摘要 | Depositing a high secondary electron yield (SEY) film on the microchannel plate (MCP) input electrode is supposed to be an effective approach to improve the photoelectron collection efficiency (CE) of photomultiplier tubes based on MCPs (MCP-PMTs). Nevertheless, secondaries promoted by the photoelectrons striking the MCP input face may cause a long tail in the time distribution of the output electrons (TDOE). In our work, laying a conductive grid upon the MCPs is proposed as an effective approach to suppress the tail. A three-dimensional MCP-PMT model is developed in CST STUDIO SUITE to systematically investigate the dependence of the TDOE on the applied voltage (U) of the grid at the coated material SEY=6. Simulation results show that high voltage applied on the grid could suppress the delay pulse effectively. The optimal U is above 500 V. © 2019 SPIE. |
| 关键词 | Photomultiplier tube Microchannel plate SEY TDOE |
| 作者部门 | 条纹相机工程中心 |
| DOI | 10.1117/12.2537851 |
| 收录类别 | EI ; CPCI |
| 语种 | 英语 |
| ISSN号 | 0277786X;1996756X |
| WOS记录号 | WOS:000511391200016 |
| EI入藏号 | 20200308041897 |
| 引用统计 | |
| 文献类型 | 会议论文 |
| 条目标识符 | http://ir.opt.ac.cn/handle/181661/93186 |
| 专题 | 条纹相机工程中心 |
| 作者单位 | 1.School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing; 211169, China; 2.School of Electronic Science and Engineering, Southeast University, Nanjing; 210096, China; 3.North Night Vision Technology (NNVT) CO., LTD, Nanjing; 210110, China; 4.Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi'An Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi'an; 710119, China |
| 推荐引用方式 GB/T 7714 | Chen, Lin,Wang, Xingchao,Tian, Jinshou,et al. Study on the tail in TDOE of the coated MCP-PMT and its suppression[C]:SPIE,2019. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| Study on the tail in（685KB） | 会议论文 | 开放获取 | CC BY-NC-SA | 请求全文 | ||
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